This work presents a single event double node upset (SEDNU) self-healing (DNUSH) latch
to meet the high-robustness requirement of the applications used in a harsh radiation …

Double-node upsets induced by the charge sharing effects are emerging as a major
reliability issue in nanometer latch design. Although the existing robust latches can provide …

As a consequence of technology scaling down, gate capacitances and stored charge in
sensitive nodes are decreasing rapidly, which makes CMOS circuits more vulnerable to …

In this paper, we propose a novel high reliability and low cost DNU (Double Node Upset)
tolerant latch, HRCE (High Robust and Cost Effective) latch, for nanoscale CMOS …

With continuous advancement in technology, latches have become highly susceptible to
radiation induced soft-errors such as multi-node-upsets (MNU). To effectively resilient the …

This paper presents the design of a radiation-hardened latch, which is self-healable from
single event upset (SEU) at all of its internal and output nodes. The proposed latch employs …

The susceptibility of sequential logic circuits to radiation induced soft errors is increasing as
CMOS transistors are scaling down and the supply voltage is decreasing. Latch circuits are …

As the semiconductor process development, it is shrinking rapidly for the distance of
adjacent transistors in integrated circuits (ICs). Hence, latches are increasingly vulnerable to …

The multiple-node upset (MNU) phenomenon caused by charge sharing increases rapidly in
advanced nano-scale latches, making it more critical to design hardened latches for MNU …

Facial recognition systems are commonly used for verification and security purposes but the
levels of accuracy are still being improved. Errors occurring in facial feature detection due to …