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An Efficient Low Power BIST for Automotive SoC With Periodic Pattern Type Selection
J Park, S Lee, H Kim, J Joung, J Kim… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
In the realm of automotive System-on-Chip (SoC), scan-based Logic Built-In Self-Test
(LBIST) is commonly utilized for in-system testing, primarily for its cost-effectiveness …
(LBIST) is commonly utilized for in-system testing, primarily for its cost-effectiveness …
A new, fast pseudo-random pattern generator for advanced logic built-in self-test structures
T Garbolino - Applied Sciences, 2021 - mdpi.com
Digital cores that are currently incorporated into advanced Systems on Chip (SoC)
frequently include Logic Built-In Self-Test (LBIST) modules with the Self-Test Using …
frequently include Logic Built-In Self-Test (LBIST) modules with the Self-Test Using …
論理 BIST におけるフレキシブルスキャンイン電力制御に関する研究
加藤隆明， カトウタカアキ - 2018 - kyutech.repo.nii.ac.jp
VLSI の微細化が進むと伴い, システムの大規模化・複雑化が進んでいる. また, システムテストや
LSI 出荷後のテスト (フィールドテスト) では, テストコストが増大する一方, 厳しい制約下でテストを …
LSI 出荷後のテスト (フィールドテスト) では, テストコストが増大する一方, 厳しい制約下でテストを …