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[ספר][B] Fundamentals of electromigration
J Lienig, M Thiele, J Lienig, M Thiele - 2018 - Springer
This chapter investigates in detail the actual low-level migration processes. A solid
grounding in the physics of electromigration (EM) and its specific effects on the interconnect …
grounding in the physics of electromigration (EM) and its specific effects on the interconnect …
Electromigration and its impact on physical design in future technologies
Electromigration (EM) is one of the key concerns going forward for interconnect reliability in
integrated circuit (IC) design. Although analog designers have been aware of the EM …
integrated circuit (IC) design. Although analog designers have been aware of the EM …
Introduction to electromigration-aware physical design
Electromigration is increasingly relevant to the physical design of electronic circuits. It is
caused by excessive current density stress in the interconnect. The ongoing reduction of …
caused by excessive current density stress in the interconnect. The ongoing reduction of …
[ספר][B] Fundamentals of layout design for electronic circuits
J Lienig, J Scheible - 2020 - Springer
When an engineer in a London Post Office got tired of sorting hundreds of tangled cables
between their connectors, he filed a patent named “Improvements in or Connected with …
between their connectors, he filed a patent named “Improvements in or Connected with …
Reliability vs. security: Challenges and opportunities for develo** reliable and secure integrated circuits
As technology further scales, devices offer better performance with faster speed and lower
power albeit at the cost of reliability. Advanced technology nodes introduce higher variations …
power albeit at the cost of reliability. Advanced technology nodes introduce higher variations …
Simultaneous analog placement and routing with current flow and current density considerations
Current-flow and current-density are two major considerations for placement and routing of
analog layout synthesis. The current-flow constraints are specified to the critical nets with …
analog layout synthesis. The current-flow constraints are specified to the critical nets with …
Electromigration-aware physical design of integrated circuits
The electromigration effect within current-density-stressed signal and power lines is an
ubiquitous and increasingly important reliability and design problem in sub-micron IC …
ubiquitous and increasingly important reliability and design problem in sub-micron IC …
Hierarchical analog and mixed-signal circuit placement considering system signal flow
Placement is a critical step in layout automation for analog and mixed-signal (AMS)-
integrated circuits (ICs). It determines the proximity of devices and influences the wiring …
integrated circuits (ICs). It determines the proximity of devices and influences the wiring …
Sageroute: Synergistic analog routing considering geometric and electrical constraints with manual design compatibility
Routing is critical to the post-layout performance of analog circuits. As modern analog
layouts need to consider both geometric constraints (eg, design rules and low bending …
layouts need to consider both geometric constraints (eg, design rules and low bending …
On potential design impacts of electromigration awareness
Reliability issues significantly limit performance improvements from Moore's-Law scaling. At
45nm and below, electromigration (EM) is a serious reliability issue which affects global and …
45nm and below, electromigration (EM) is a serious reliability issue which affects global and …