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[PDF][PDF] Advanced 3D laser microscopy for measurements and analysis of vitrified bonded abrasive tools
In many applications, when a precise non-contact assessment of an abrasive tools' surface
is required, alternative measurement methods are often used. Their use offers numerous …
is required, alternative measurement methods are often used. Their use offers numerous …
Near-perfect replication on amorphous alloys through active force modulation based on machine learning/neural network parameter prediction
S Meng, Z Wang, R Zhu, R Liu, J Ma, L Hu… - Science China Physics …, 2025 - Springer
As a microforming technique, micro/nano-structural replication possesses advantages of
high precision and efficiency. With the remarkable superplasticity in the supercooled liquid …
high precision and efficiency. With the remarkable superplasticity in the supercooled liquid …
[HTML][HTML] Label-free single cell viability assay using laser interference microscopy
Y Beloglazova, A Nikitiuk, A Voronina, O Gagarskikh… - Biology, 2021 - mdpi.com
Simple Summary Currently, only a few label-free methods for cell viability assessment are
described in the literature. This paper covers a new label-free method based on the laser …
described in the literature. This paper covers a new label-free method based on the laser …
Effect of electrochemical micromachining process parameters on surface roughness and dimensional deviation of Ti6Al4V by tungsten electrode
VR Perla, SK Suraparaju, KJ RathanRaj… - Recent Advances in …, 2020 - Springer
The electrochemical micromachining (ECMM) is a special form of conventional ECM
process in which the tool electrode is at micro-level used to produce micro-features. This …
process in which the tool electrode is at micro-level used to produce micro-features. This …
[PDF][PDF] Лазерная интерференционная микроскопия для нанобиотехнологий
ПС Игнатьев, КВ Индукаев, ПА Осипов… - Медицинская …, 2013 - mtjournal.ru
Аннотация Разработано новое поколение лазерных интерференционных микроскопов
МИМ, предназначенных для измерения геометриа ческих параметров трехмерного …
МИМ, предназначенных для измерения геометриа ческих параметров трехмерного …
Investigation into micro and nano scale optical metrology for shiny surfaces and difficult to access aircraft engine components
A Haridas - 2019 - dr.ntu.edu.sg
Industrial production has always been driven by global competition and the need for efficient
market adaptation. A strategic initiative termed as Industry 4.0 was recently introduced to …
market adaptation. A strategic initiative termed as Industry 4.0 was recently introduced to …
[PDF][PDF] Asian Journal of Physics
Industrial production has always been driven by global competition and the need for efficient
market adaptation. A strategic initiative termed Industry 4.0 was recently introduced to cater …
market adaptation. A strategic initiative termed Industry 4.0 was recently introduced to cater …
Micro and nano scale optical metrology for shiny surfaces and difficult to access aircraft engine components–A review
Industrial production has always been driven by global competition and the need for efficient
market adaptation. A strategic initiative termed Industry 4.0 was recently introduced to cater …
market adaptation. A strategic initiative termed Industry 4.0 was recently introduced to cater …
[PDF][PDF] Calibration of a White-Light Interferometer with a use of material measures recommended by ISO 25178 series: Reliability and Uncertainty
M Wiśniewska, S Żebrowska-Łucyk - Proc. XXI IMEKO World Congress, 2015 - imeko.info
Abstract− There is a discrepancy between rapid pace of introducing more and more
sophisticated white-light interferometers and a tardy tempo of develo** proper calibration …
sophisticated white-light interferometers and a tardy tempo of develo** proper calibration …
Badania porównawcze chropowatości powierzchni gładkich za pomocą skaterometrii, interferometrii i mikroskopii sił atomowych
R Synak, M Pawełczak, W Lipiński… - Elektronika …, 2013 - repo.bg.wat.edu.pl
Instruments destined for testing smooth surface parameters, based on the following
principles: scatterometry (TIS), white light interferometry and atomic force microscopy have …
principles: scatterometry (TIS), white light interferometry and atomic force microscopy have …