[HTML][HTML] Complementary LEEM and eV-TEM for imaging and spectroscopy
Transmission electron microscopy at very low energy is a promising way to avoid damaging
delicate biological samples with the incident electrons, a known problem in conventional …
delicate biological samples with the incident electrons, a known problem in conventional …
Graphene-substrate decoupling by S segregation. A LEEM/LEED study
M Suzuki, Y Yamauchi, D Fujita, T Yasue, T Koshikawa… - Carbon, 2021 - Elsevier
The growth of graphene on Ni (110) is studied with low energy electron microscopy, low
energy electron diffraction (LEED) and associated methods at several sulfur coverages …
energy electron diffraction (LEED) and associated methods at several sulfur coverages …
[PDF][PDF] ELECTRONVOLT ENERGIES
MD AT - scholarlypublications …
The electron mean free path (MFP) is a material-specific quantity, describing the decay
length of an electron beam through a material at a specific electron energy. Especially the …
length of an electron beam through a material at a specific electron energy. Especially the …