Four-dimensional scanning transmission electron microscopy (4D-STEM): From scanning nanodiffraction to ptychography and beyond

C Ophus - Microscopy and Microanalysis, 2019 - cambridge.org
Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …

Dr. Probe: A software for high-resolution STEM image simulation

J Barthel - Ultramicroscopy, 2018 - Elsevier
Abstract The Dr. Probe software for multislice simulations of STEM images is introduced, and
reference is given of the applied methods. Major program features available with the …

Smart Align—a new tool for robust non-rigid registration of scanning microscope data

L Jones, H Yang, TJ Pennycook, MSJ Marshall… - Advanced Structural and …, 2015 - Springer
Many microscopic investigations of materials may benefit from the recording of multiple
successive images. This can include techniques common to several types of microscopy …

Advances and applications of atomic-resolution scanning transmission electron microscopy

JJ Liu - Microscopy and Microanalysis, 2021 - cambridge.org
Although scanning transmission electron microscopy (STEM) images of individual heavy
atoms were reported 50 years ago, the applications of atomic-resolution STEM imaging …

[HTML][HTML] Catalytic applications of single-atom metal-anchored hydroxides: Recent advances and perspective

X Duan, T Li, X Jiang, X Liu, L ** isolated single atomic noble metal catalysts is one of the most effective methods
to maximize noble metal atom utilization efficiency and enhance catalytic performances …

Three-Dimensional Imaging of Individual Dopant Atoms in

J Hwang, JY Zhang, AJ D'Alfonso, LJ Allen… - Physical review letters, 2013 - APS
We report on three-dimensional (3D) imaging of individual Gd dopant atoms in a thin (<?
format?>∼<? format?> 2.3 nm) foil<? format?> of SrTiO 3, using quantitative scanning …

Nanoscale map** of hydrogen evolution on metallic and semiconducting MoS 2 nanosheets

T Sun, H Zhang, X Wang, J Liu, C ** via absolute-scale energy dispersive X-ray spectroscopy
Z Chen, M Weyland, X Sang, W Xu, JH Dycus… - Ultramicroscopy, 2016 - Elsevier
Quantitative agreement on an absolute scale is demonstrated between experiment and
simulation for two-dimensional, atomic-resolution elemental map** via energy dispersive …

Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy

KHW Van Den Bos, A De Backer, GT Martinez… - Physical Review Letters, 2016 - APS
The development of new nanocrystals with outstanding physicochemical properties requires
a full three-dimensional (3D) characterization at the atomic scale. For homogeneous …