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Thin-film semiconductor device including a semiconductor film with high field-effect mobility
Y Nakata, M Fujihara, M Date, T Matsuo… - US Patent …, 1998 - Google Patents
57 ABSTRACT A thin film transistor includes: a substrate; a gate electrode, a source
electrode and a drain electrode formed above the substrate; and an insulating film and a …
electrode and a drain electrode formed above the substrate; and an insulating film and a …
Roles of atomic hydrogen in chemical annealing
K Nakamura, K Yoshino, S Takeoka… - Japanese Journal of …, 1995 - iopscience.iop.org
A systematic study has been performed to reveal the role of atomic hydrogen in chemical
annealing, where the deposition of a thin layer and treatment with atomic hydrogen are …
annealing, where the deposition of a thin layer and treatment with atomic hydrogen are …
Role of atomic hydrogen during growth of hydrogenated amorphous silicon in the “chemical annealing”
H Shirai, JHJ Hanna, ISI Shimizu - Japanese journal of applied …, 1991 - iopscience.iop.org
In our previous paper, we proposed a novel preparation technique termed" Chemical
annealing" to make a rigid and stable Si-network. In this letter, with the aim of the …
annealing" to make a rigid and stable Si-network. In this letter, with the aim of the …
Wide optical-gap a-SiO: H films prepared by rf glow discharge
Hydrogenated amorphous silicon oxygen alloy (a-SiO: H) films have been prepared at a
temperature of 200° C by a rf plasma deposition process. A controlled widening in the …
temperature of 200° C by a rf plasma deposition process. A controlled widening in the …
Hydrogen plasma induced microcrystallization in layer-by-layer growth scheme
D Das, M Jana - Solar energy materials and solar cells, 2004 - Elsevier
Significant improvement in the microcrystallization in Si: H network has been demonstrated
by introducing layer-by-layer (LBL) growth and H-plasma treatment on the stacking layers …
by introducing layer-by-layer (LBL) growth and H-plasma treatment on the stacking layers …
Quantum confinement effects in nano-silicon thin films
D Das - Solid state communications, 1998 - Elsevier
Stacked layer Si: H films deposited by interrupted growth and H-plasma exposure were
characterized by optical and IR absorption, Raman scattering, TEM and PL studies …
characterized by optical and IR absorption, Raman scattering, TEM and PL studies …
Micro-Raman and ultraviolet ellipsometry studies on μc-Si:H films prepared by dilution to the Ar-assisted plasma in radio frequency glow discharge
D Das - Journal of applied physics, 2003 - pubs.aip.org
Micro-Raman and ultraviolet ellipsometry studies have been performed on μc-Si: H films
prepared by increasing the H 2 dilution to the Ar-assisted SiH 4 plasma in rf glow discharge …
prepared by increasing the H 2 dilution to the Ar-assisted SiH 4 plasma in rf glow discharge …
Evidence of electron and hole inversion in GaAs metal-oxide-semiconductor capacitors with HfO2 gate dielectrics and α-Si∕ SiO2 interlayers
SJ Koester, EW Kiewra, Y Sun, DA Neumayer… - Applied physics …, 2006 - pubs.aip.org
Evidence of inversion in GaAs metal-oxide-semiconductor capacitors with Hf O 2 gate
dielectrics and α-Si∕ Si O 2 interlayers is reported. Capacitors formed on n-Ga As with …
dielectrics and α-Si∕ Si O 2 interlayers is reported. Capacitors formed on n-Ga As with …
A novel approach towards silicon nanotechnology
D Das - Journal of Physics D: Applied Physics, 2003 - iopscience.iop.org
Growth interruption and H-plasma exposure on stacking layers provide an intellectually
challenging route for the deposition and control of Si nanostructures. Atomic H of the plasma …
challenging route for the deposition and control of Si nanostructures. Atomic H of the plasma …
Fluorocarbon radicals and surface reactions in fluorocarbon high density etching plasma. II. H2 addition to electron cyclotron resonance plasma employing CHF3
K Takahashi, M Hori, T Goto - … of Vacuum Science & Technology A …, 1996 - pubs.aip.org
Gas phase reactions of CF x (x= 1–3) radicals and F atoms in an electron cyclotron
resonance (ECR) downstream plasma have been investigated at 300 W and a CHF3 …
resonance (ECR) downstream plasma have been investigated at 300 W and a CHF3 …