[HTML][HTML] Neuromorphic computing using emerging synaptic devices: A retrospective summary and an outlook

J Park - Electronics, 2020 - mdpi.com
In this paper, emerging memory devices are investigated for a promising synaptic device of
neuromorphic computing. Because the neuromorphic computing hardware requires high …

Microscopic Modeling of HfOx RRAM Operations: From Forming to Switching

A Padovani, L Larcher, O Pirrotta… - … on electron devices, 2015 - ieeexplore.ieee.org
We propose a model describing the operations of hafnium oxide-based resistive random
access memory (RRAM) devices at the microscopic level. Charge carrier and ion transport …

A physics-based compact model of metal-oxide-based RRAM DC and AC operations

P Huang, XY Liu, B Chen, HT Li… - IEEE transactions on …, 2013 - ieeexplore.ieee.org
A physics-based compact model of metal-oxide-based resistive-switching random access
memory (RRAM) cell under dc and ac operation modes is presented. In this model, the …

A Complete Statistical Investigation of RTN in HfO2-Based RRAM in High Resistive State

FM Puglisi, L Larcher, A Padovani… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
In this paper, we investigate the random telegraph noise (RTN) in hafnium-oxide resistive
random access memories in high resistive state (HRS). The current fluctuations are …

RRAMs based on anionic and cationic switching: a short overview

S Clima, K Sankaran, YY Chen… - physica status solidi …, 2014 - Wiley Online Library
Resistive random access memories are emerging as a new type of memory that has the
potential to combine both the speed of volatile and the retention of nonvolatile memories. It …

Resistive switching and synaptic behaviors of an HfO2/Al2O3 stack on ITO for neuromorphic systems

C Mahata, C Lee, Y An, MH Kim, S Bang… - Journal of Alloys and …, 2020 - Elsevier
This work reports on the bipolar resistive switching (RS) characteristics and possible
applicability to transparent synaptic devices when an ultrathin Al 2 O 3 interfacial layer is …

Random telegraph noise in resistive random access memories: Compact modeling and advanced circuit design

FM Puglisi, N Zagni, L Larcher… - IEEE Transactions on …, 2018 - ieeexplore.ieee.org
In this paper, we report about the derivation of a physics-based compact model of random
telegraph noise (RTN) in HfO 2-based resistive random access memory (RRAM) devices …

Exploration of lead-free novel double perovskite halides Na2TlBiX6 (X= Cl, Br, I) for flexible memory devices: Using DFT approach

IA Shah, M Imran, F Hussain, U Rasheed… - Materials Chemistry and …, 2024 - Elsevier
Flexible resistive switching random access memory (RRAM) devices have drawn significant
attention due to their low power consumption, high speed and simple structure. Halide …

Electroforming and resistive switching in silicon dioxide resistive memory devices

BW Fowler, YF Chang, F Zhou, Y Wang, PY Chen… - RSC Advances, 2015 - pubs.rsc.org
Electroforming and resistive switching in SiO2 materials are investigated by controlling the
annealing temperature, etching time and operating ambient. Thermal anneal in reducing …

A Compact Model of Program Window in HfOx RRAM Devices for Conductive Filament Characteristics Analysis

L Larcher, FM Puglisi, P Pavan… - … on Electron Devices, 2014 - ieeexplore.ieee.org
This paper presents a physics-based compact model for the program window in HfOx
resistive random access memory devices, defined as the ratio of the resistances in high …