Fail-slow at scale: Evidence of hardware performance faults in large production systems

HS Gunawi, RO Suminto, R Sears, C Golliher… - ACM Transactions on …, 2018 - dl.acm.org
Fail-slow hardware is an under-studied failure mode. We present a study of 114 reports of
fail-slow hardware incidents, collected from large-scale cluster deployments in 14 …

Enhanced precision through multiple reads for LDPC decoding in flash memories

J Wang, K Vakilinia, TY Chen… - IEEE Journal on …, 2014 - ieeexplore.ieee.org
Multiple reads of the same Flash memory cell with distinct word-line voltages provide
enhanced precision for LDPC decoding. In this paper, the word-line voltages are optimized …

High-density image storage using approximate memory cells

Q Guo, K Strauss, L Ceze, HS Malvar - ACM SIGPLAN Notices, 2016 - dl.acm.org
This paper proposes tailoring image encoding for an approximate storage substrate. We
demonstrate that indiscriminately storing encoded images in approximate memory …

Improving the Reliability of Next Generation {SSDs} using {WOM-v} Codes

S Jaffer, K Mahdaviani, B Schroeder - 20th USENIX Conference on File …, 2022 - usenix.org
High density Solid State Drives, such as QLC drives, offer increased storage capacity, but a
magnitude lower Program and Erase (P/E) cycles, limiting their endurance and hence …

Flash-oriented Coded Storage: Research Status and Future Directions

Z Li, G Zhang, Y Wang - ACM Transactions on Storage, 2024 - dl.acm.org
Flash-based solid-state drives (SSDs) have been widely adopted in various storage
systems, manifesting better performance than their forerunner HDDs. However, the …

Using error modes aware LDPC to improve decoding performance of 3-D TLC NAND flash

F Wu, M Zhang, Y Du, W Liu, Z Lu… - … on Computer-Aided …, 2019 - ieeexplore.ieee.org
3-D triple-level cell (3-D TLC) NAND flash has high storage density and capacity, but
degrading data reliability due to high raw bit error rates induced by a certain number of …

Error analysis and inter-cell interference mitigation in multi-level cell flash memories

V Taranalli, H Uchikawa… - 2015 IEEE International …, 2015 - ieeexplore.ieee.org
With an aim to characterize, model and understand the types of errors caused by the inter-
cell interference (ICI) effect in flash memories, we perform a series of program/erase (P/E) …

The Devil Is in the Details: Implementing Flash Page Reuse with {WOM} Codes

F Margaglia, G Yadgar, E Yaakobi, Y Li… - … USENIX Conference on …, 2016 - usenix.org
Flash memory is prevalent in modern servers and devices. Coupled with the scaling down of
flash technology, the popularity of flash memory motivates the search for methods to …

Channel coding for nonvolatile memory technologies: Theoretical advances and practical considerations

L Dolecek, Y Cassuto - Proceedings of the IEEE, 2017 - ieeexplore.ieee.org
Every bit of information in a storage or memory device is bound by a multitude of
performance specifications, and is subject to a variety of reliability impediments. At the other …

Channel models for multi-level cell flash memories based on empirical error analysis

V Taranalli, H Uchikawa… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
We propose binary discrete parametric channel models for multi-level cell (MLC) flash
memories that provide accurate error-correcting code (ECC) performance estimation by …