Accurate and effective localization of reliability-critical gates (RCGs) is one of the important
prerequisites for low-cost circuit fault tolerance in the early stages of circuit design. This …

In nanometric integrated circuits, to harden reliability-critical gates (RCGs) is an important
step to improve overall circuit reliability at a low cost. To locate RCGs quickly and efficiently …

The identification of reliability-critical primary input leads (RCPIs) plays an important role in
the testing and prediction of reliability boundaries of logic circuits. This article presents a …

Accurate and efficient identification of reliability-critical paths (RCPs) not only facilitates fault
localization and troubleshooting but also allows circuit designers to improve circuit reliability …

Radiation-induced single transient faults (STFs) are expected to evolve into multiple
transient faults (MTFs) at nanoscale CMOS technology nodes. For this reason, the reliability …

Reliable circuits help prevent artificial intelligence (AI) systems from being corrupted by the
soft errors occurred in memories or combinational circuits, which promotes the development …

In a spacecraft, flip-flops take part in holding operational configuration for long durations.
Single event transients (SETs) at control inputs of such flip-flops can culminate in single …

Transient faults analysis is an important step in circuits designing flow. By a fast and
accurate scrutiny, it is possible to achieve a cost-effective and soft error tolerant system. In …

When electronic systems are working in radiation environments, transient errors, and
permanent errors may occur. Static random-access memory (SRAM) has been the one of …

Identifying the critical paths is crucial to reducing the complexity of performance analysis and
reliability calculation for logic circuits. In this article, we propose a method for identifying the …