Scanning probe microscopy applied to organic–inorganic halide perovskite materials and solar cells
To meet the increasing energy demands of the growing society, environmentally friendly and
renewable energy sources are needed. Organic–inorganic halide perovskites are a …
renewable energy sources are needed. Organic–inorganic halide perovskites are a …
Active scanning probes: A versatile toolkit for fast imaging and emerging nanofabrication
With the recent advances in the field of nanotechnology, measurement and manipulation
requirements at the nanoscale have become more stringent than ever before. In atomic force …
requirements at the nanoscale have become more stringent than ever before. In atomic force …
High-speed atomic force microscopy in ultra-precision surface machining and measurement: challenges, solutions and opportunities
The atomic force microscope (AFM) possesses a unique capability for three-dimensional,
high-resolution imaging down to the atomic level. It operates without the needs of additional …
high-resolution imaging down to the atomic level. It operates without the needs of additional …
High resolution atomic force microscopy with an active piezoelectric microcantilever
Active microcantilevers with on-chip sensing and actuation provide significant advantages in
tap** mode Atomic Force Microscopy (AFM). Collocated transduction allows for effective …
tap** mode Atomic Force Microscopy (AFM). Collocated transduction allows for effective …
Digital cultural heritage preservation in art painting: a surface roughness approach to the brush strokes
There is a growing interest in cultural heritage preservation. The notion of HyperHeritage
highlights the creation of new means of communication for the perception and data …
highlights the creation of new means of communication for the perception and data …
High dynamic range AFM cantilever with a collocated piezoelectric actuator-sensor pair
We present a novel approach to fundamentally eliminate electrical feedthrough (cross-talk)
signal in self-sensing piezoelectric microcantilevers, used in dynamic mode atomic force …
signal in self-sensing piezoelectric microcantilevers, used in dynamic mode atomic force …
FPAA-based control of a high-speed flexure-guided AFM nanopositioner
This paper presents the design, characterization, and control of a novel flexure-guided
piezoelectrically actuated atomic force microscope (AFM) nanopositioner. The planar …
piezoelectrically actuated atomic force microscope (AFM) nanopositioner. The planar …
Nanofabrication by field-emission scanning probe lithography and cryogenic plasma etching
Building low-power and high-density circuits requires new devices, which can be based for
example on single electron effects. Single electron transistors (SET), which can operate at …
example on single electron effects. Single electron transistors (SET), which can operate at …
Lights out! nano-scale topography imaging of sample surface in opaque liquid environments with coated active cantilever probes
Atomic force microscopy is a powerful topography imaging method used widely in
nanoscale metrology and manipulation. A conventional Atomic Force Microscope (AFM) …
nanoscale metrology and manipulation. A conventional Atomic Force Microscope (AFM) …