An evident challenge ahead for the integrated circuit (IC) industry is the investigation and
development of methods to reduce the design complexity ensuing from growing process …

This paper presents a novel hardware Trojan detection technique in gate-level netlist based
on the controllability and observability analyses. Using an unsupervised clustering analysis …

Counterfeit integrated circuits (ICs) pose a major concern to the industry and government as
they potentially impact the security and reliability of a wide variety of electronic systems. A …

To locate and correct design errors that escape pre-silicon verification, silicon debug has
become a necessary step in the implementation flow of digital integrated circuits. Embedded …

This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI
practitioners and researchers in need of fluency in an" adjacent" field will find this an …

Test data compression consists of test vector compression on the input side and response,
compaction on the output side. This vector compression has been an active area of …

The insistent trend in today's nanoscale technology, to keep abreast of the Moore's law, has
been continually opening up newer challenges to circuit designers. With rapid downscaling …

Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

Conventional semiconductor-based digital electronics, with complementary metal oxide
semiconductor (CMOS) technology as the primary example, has experienced meteoric …

More and more Agile projects are seeking architectural roots as they struggle with
complexity and scale-and they're seeking lightweight ways to do it Still seeking? In this book …