Investigation of the propagation induced pulse broadening (PIPB) effect on single event transient...

Single event transients in digital CMOS—A review

V Ferlet-Cavrois, LW Massengill… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
The creation of soft errors due to the propagation of single event transients (SETs) is a
significant reliability challenge in modern CMOS logic. SET concerns continue to be …
Shrani Navedi Navedeno v 453 virih Sorodni članki Vse različice: 3
[免费ChatGPT] [DeepSeek可用网址] [PDF] ieee.org

Scaling trends of digital single-event effects: A survey of SEU and SET parameters and comparison with transistor performance

D Kobayashi - IEEE Transactions on Nuclear Science, 2020 - ieeexplore.ieee.org
The history of integrated circuit (IC) development is another record of human challenges
involving space. Efforts have been made to protect ICs from sudden malfunctions due to …
Shrani Navedi Navedeno v 95 virih Sorodni članki Vse različice: 4

Pulsed-laser testing for single-event effects investigations

SP Buchner, F Miller, V Pouget… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
The application of pulsed lasers to the study of Single-Event Effects (SEEs) in integrated
circuits and devices is described. The role of a pulsed laser is to provide spatial and …
Shrani Navedi Navedeno v 205 virih Sorodni članki Vse različice: 4

Soft error reliability in advanced CMOS technologies-trends and challenges

D Tang, CH He, YH Li, H Zang, C ** proper
mitigation schemes to single-event effects (SEE), especially for advanced technologies. This …
Shrani Navedi Navedeno v 61 virih Sorodni članki Vse različice: 2

[KNJIGA][B] Radiation effects in semiconductors

K Iniewski - 2018 - taylorfrancis.com
Space applications, nuclear physics, military operations, medical imaging, and especially
electronics (modern silicon processing) are obvious fields in which radiation damage can …
Shrani Navedi Navedeno v 89 virih Sorodni članki Vse različice: 6 V obliki HTML

A methodology for characterization of SET propagation in SRAM-based FPGAs

H Liang, X Xu, Z Huang, C Jiang, Y Lu… - … on Nuclear Science, 2016 - ieeexplore.ieee.org
This paper presents a methodology for accurate characterization of Single Event Transient
(SET) propagation in SRAM-based Field Programmable Gate Arrays (FPGAs): both …
Shrani Navedi Navedeno v 47 virih Sorodni članki Vse različice: 3