Van der Waals epitaxy of iii‐nitride semiconductors based on 2D materials for flexible applications

J Yu, L Wang, Z Hao, Y Luo, C Sun, J Wang… - Advanced …, 2020 - Wiley Online Library
III‐nitride semiconductors have attracted considerable attention in recent years owing to
their excellent physical properties and wide applications in solid‐state lighting, flat‐panel …

III-nitride semiconductor lasers grown on Si

M Feng, J Liu, Q Sun, H Yang - Progress in Quantum Electronics, 2021 - Elsevier
III-nitride semiconductor laser directly grown on Si is a potential on-chip light source for Si
photonics. Moreover, it may greatly lower the manufacture cost of laser diodes and further …

Molecular beam epitaxy growth of GaN, AlN and InN

X Wang, A Yoshikawa - Progress in crystal growth and characterization of …, 2004 - Elsevier
III-Nitrides receive much research attention and obtain significant development due to their
wide applications in light emitting diodes, laser diodes, ultraviolet detectors, solar cells, field …

New approaches to produce large‐area single crystal thin films

G Kim, D Kim, Y Choi, A Ghorai, G Park… - Advanced …, 2023 - Wiley Online Library
Wafer‐scale growth of single crystal thin films of metals, semiconductors, and insulators is
crucial for manufacturing high‐performance electronic and optical devices, but still …

Progress in Electrochemical Etching of Third-Generation Semiconductors

Y Chen, P Yu, Y Zhong, S Dong, M Hou… - ECS Journal of Solid …, 2023 - iopscience.iop.org
The third-generation semiconductors have richer and better properties than traditional
semiconductors, and show promising application prospects in high-power, high …

Determination of the refractive indices of AlN, GaN, and AlxGa1− xN grown on (111) Si substrates

N Antoine-Vincent, F Natali, M Mihailovic… - Journal of applied …, 2003 - pubs.aip.org
The refractive indices of several AlxGa1xN alloys deposited on silicon are determined by
ellipsometry and reflectivity experiments at room temperature. The AlGaN layers are grown …

Monolithic integration of silicon CMOS and GaN transistors in a current mirror circuit

WE Hoke, RV Chelakara, JP Bettencourt… - Journal of Vacuum …, 2012 - pubs.aip.org
GaN high electron mobility transistors (HEMTs) were monolithically integrated with silicon
CMOS to create a functional current mirror circuit. The integrated circuit was fabricated on …

From spiral growth to kinetic roughening in molecular-beam epitaxy of GaN (0001)

S Vézian, F Natali, F Semond, J Massies - Physical Review B, 2004 - APS
Surface roughening of GaN layers grown by molecular-beam epitaxy using NH 3 as a
nitrogen source on Si (111) substrates has been studied by ex situ atomic force microscopy …

Growth of high quality crack-free AlGaN films on GaN templates using plastic relaxation through buried cracks

JM Bethoux, P Vennéguès, F Natali, E Feltin… - Journal of applied …, 2003 - pubs.aip.org
A method is presented to achieve thick high quality crack-free AlGaN layers on GaN. This
method uses jointly plastic relaxation and lateral growth. In a first step, plastic relaxation by …

Valence band offset of the ZnO/AlN heterojunction determined by x-ray photoemission spectroscopy

TD Veal, PDC King, SA Hatfield, LR Bailey… - Applied Physics …, 2008 - pubs.aip.org
The valence band offset of ZnO/AlN heterojunctions is determined by high resolution x-ray
photoemission spectroscopy. The valence band of ZnO is found to be 0.43±0.17 eV below …