[KNJIGA][B] Semiconductor surfaces and interfaces

W Mönch - 2013 - books.google.com
Semiconductor Surfaces and Interfaces deals with structural and electronic properties of
semiconductor surfaces and interfaces. The first part introduces the general aspects of …

Origin of surface states on Si (111)(7× 7)

JE Northrup - Physical review letters, 1986 - APS
First-principles pseudopotential total-energy and electronic-structure calculations are
reported for two Si (111)(√ 3×√ 3): Si adatom geometries. Based on these calculations, a …

Unoccupied surface states revealing the Si(111)√3 √3 -Al, -Ga, and -In adatom geometries

JM Nicholls, B Reihl, JE Northrup - Physical Review B, 1987 - APS
Abstract k-resolved inverse-photoemission spectroscopy has been used to determine the
empty surface-state band structures of Si (111)√ 3×√ 3-Al,-Ga, and-In surfaces. The results …

Electronic structure of silicon surfaces: clean and with ordered overlayers

RIG Uhrberg, GV Hansson - Critical Reviews in Solid State and …, 1991 - Taylor & Francis
Recent photoemission results on the electronic structure of clean, reconstructed Si (111) and
Si (100) surfaces are reviewed. Changes in the electronic and atomic structure induced by …

Effects of coverage on the geometry and electronic structure of Al overlayers on Si (111)

RJ Hamers - Physical Review B, 1989 - APS
Scanning tunneling microscopy (STM) has been used to study the coverage dependence of
the atomic geometry and electronic structure of ordered overlayers of aluminum on Si (111) …

Electron correlation, metallization, and Fermi-level pinning at ultrathin K/Si (111) interfaces

HH Weitering, J Chen, NJ DiNardo, EW Plummer - Physical Review B, 1993 - APS
In this paper we present a detailed photoemission study of the K/Si (111) 7× 7 and K/Si
(111)(√ 3×√ 3) R30-B interfaces. Angle-resolved valence-band spectroscopy reveals the …

Electronic structure of localized Si dangling-bond defects by tunneling spectroscopy

RJ Hamers, JE Demuth - Physical review letters, 1988 - APS
Scanning tunneling microscopy is used to determine the atomic structure, charge state, and
electronic energy spectrum of isolated Si dangling-bond defects at the Al/Si (111) surface. Si …

Rocking-curve analysis of reflection high-energy electron diffraction from the Si(111)-(√3 × √3 )R30°-Al, -Ga, and -In surfaces

T Hanada, H Daimon, S Ino - Physical Review B, 1995 - APS
Rocking curves of reflection high-energy electron diffraction (RHEED) have been measured
from the Si (111)-(√ 3×√ 3) R30-Al,-Ga, and-In surfaces at [21 1] incidence. Dynamical …

Angle-resolved photoelectron-spectroscopy study of the Si(111) -Sn surface: Comparison with Si(111) -Al, -Ga, and -In surfaces

T Kinoshita, S Kono, T Sagawa - Physical Review B, 1986 - APS
Angle-resolved ultraviolet photoelectron spectra have been measured for the Si (111) 3× 3-
Sn surface. It has been found that the surface-state dispersions are very similar to those …

Atomic structure of Si(111)-(√3 × √3 )R30°-Al studied by dynamical low-energy electron diffraction

H Huang, SY Tong, WS Yang, HD Shih, F Jona - Physical Review B, 1990 - APS
We have carried out a quantitative low-energy electron-diffraction intensity analysis of a Si
(111)-(√ 3×√ 3) R30-Al structure. We found that Al atoms on a√ 3×√ 3 array are absorbed …