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Soft lithography
Y ** mode atomic force microscopy
R Brandsch, G Bar, MH Whangbo - Langmuir, 1997 - ACS Publications
Tap** mode atomic force microscopy measurements were performed for patterned self-
assembled monolayers (SAMs) of− S (CH2) 15CH3 and− S (CH2) 15COOH groups on a …
assembled monolayers (SAMs) of− S (CH2) 15CH3 and− S (CH2) 15COOH groups on a …
A Study of Alkyl Chain Conformational Changes in Self-Assembled n-Octadecyltrichlorosilane Monolayers on Fused Silica Surfaces
Y Liu, LK Wolf, MC Messmer - Langmuir, 2001 - ACS Publications
The adsorption and conformational changes of n-octadecyltrichlorosilane (OTS) self-
assembled monolayers on fused silica surfaces are monitored by a nonlinear optical …
assembled monolayers on fused silica surfaces are monitored by a nonlinear optical …
[HTML][HTML] The scanning force microscope as a tool for the detection of local mechanical properties within the interphase of fibre reinforced polymers
Scanning force microscopy (SFM) has been used to assess the local mechanical properties
of fibre-reinforced polymers. Using a sinusoidal displacement modulation (DM) and lock-in …
of fibre-reinforced polymers. Using a sinusoidal displacement modulation (DM) and lock-in …