(57) ABSTRACT A System for calibrating cables attached to a time measure ment device is
disclosed. The System includes a calibration device that generates a plurality of …

Techniques for correcting time synchronization inaccuracy caused by asymmetric delays on
a communication link. Time synchronization according to the present techniques includes …

(57) ABSTRACT A timing adjusting circuit is mounted on a Semiconductor device. A
reference signal TREFIN and signals TPa to TPX to be adjusted are Supplied from a tester …

A time measurement circuit includes N time stam** units that each includes a dual
sinusoid interpolator for achieving high timing resolution. The time measurement circuit is …

The present technology relates to a method and apparatus for measuring the signal skew
associated with each distinct signal path connecting a device under test (DUT). Such as an …

An example apparatus is for use in calibration of a test system having multiple channels and
a socket for receiving a device under test. The example apparatus includes a device …

A method and apparatus for testing a device using transition timestamp are used to evaluate
output signals from the device. The method comprises the steps of performing timing tests on …

A preferred integrated circuit (IC) includes a first pad electrically communicating with at least
a portion of the IC. The first pad includes a first driver and a first receiver, with the first driver …

BACKGROUND Automatic test equipment is commonly used by electron ics device
manufacturers for detecting manufacturing 20 defects. For example, automatic test …

Related US Application Dat e pplication Uata Primary Examiner Esaw T Abraham (63)
Continuation-in-part of application No. 10/101.564, filed on Mar. 18, 2002, now Pat. No …