Stability, reliability, and robustness of GaN power devices: A review
Gallium nitride (GaN) devices are revolutionarily advancing the efficiency, frequency, and
form factor of power electronics. However, the material composition, architecture, and …
form factor of power electronics. However, the material composition, architecture, and …
Characterization of electrical switching safe operation area on Schottky-type p-GaN gate HEMTs
Y Huang, Q Jiang, S Huang, X Wang… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Gallium nitride (GaN) high electron mobility transistors (HEMTs) have demonstrated their
superior performance in consumer electronics. However, their longer-lifetime-demanding …
superior performance in consumer electronics. However, their longer-lifetime-demanding …
Ultra-Wideband Contactless Current Sensors for Power Electronics Applications
AP Sirat - 2023 - search.proquest.com
Enhanced power density factors can be achieved in the new generation of power electronics
by utilizing wide-bandgap semiconductor switching devices with higher switching speeds …
by utilizing wide-bandgap semiconductor switching devices with higher switching speeds …
Reliability assessment for dual-active-bridge converter with fault tolerant capability
Currently, dual-active-bridge (DAB) converters are widely adopted as the power interface to
achieve a bidirectional power flow and galvanic isolation in high-frequency dc power …
achieve a bidirectional power flow and galvanic isolation in high-frequency dc power …
Design rules to establish a credible More‐Electric Engine baseline power architecture concept
Abstract The More‐Electric Engine (MEE), with its electrified engine auxiliary systems and
increased multi‐shaft power offtake, is likely to become an increasingly central aspect of …
increased multi‐shaft power offtake, is likely to become an increasingly central aspect of …
Improved power semiconductor dynamic testing circuit to suppress leakage current
X Hui, P Ning, D Zheng, T Fan… - IEEE Journal of …, 2024 - ieeexplore.ieee.org
Double pulse testing (DPT) is widely used for dynamic performance testing of power
semiconductors, as it can quickly obtain dynamic characterization parameters. In recent …
semiconductors, as it can quickly obtain dynamic characterization parameters. In recent …
Loss Measurement of Low RDS Devices Through Thermal Modelling - The Advantage of Not Turning it Fully On
JM Sanz-Alcaine, FJ Perez-Cebolla… - 2023 25th European …, 2023 - ieeexplore.ieee.org
This paper presents and evaluates a novel method for generating power losses on
transistors avoiding high currents. These could heat up the circuit tracks, affecting the …
transistors avoiding high currents. These could heat up the circuit tracks, affecting the …
10 MHz-Switching on GaN Trench CAVET up to 300° C Operation Enabled by High Channel Mobility
High-frequency, up to 10 MHz, switching of normally-on GaN trench CAVETs was
demonstrated using an on-wafer double pulse test (DPT) system, along with high …
demonstrated using an on-wafer double pulse test (DPT) system, along with high …
Test Setup to Study Threshold Voltage Shift of GaN-HEMTs Under Short-and Long-Term Gate and Drain Bias
B Kohlhepp, D Breidenstein… - IEEE Journal of Emerging …, 2024 - ieeexplore.ieee.org
GaN-HEMTs offer low on-state resistance and fast switching transitions. Thus, these devices
represent attractive candidates to build high efficient power converters with high power …
represent attractive candidates to build high efficient power converters with high power …
Impact of P-GaN ohmic contact resistivity on switching time of GaN super-heterojunction FETs
Y Du, J Kemmerling, J Song… - 2024 Device …, 2024 - ieeexplore.ieee.org
Gallium nitride (GaN) Super-Heterojunction FET (SHJ-FET) utilizes a charge-balanced PN
heterojunction, instead of a field-plate structure, to manage the E-field profile between the …
heterojunction, instead of a field-plate structure, to manage the E-field profile between the …