Stability, reliability, and robustness of GaN power devices: A review

JP Kozak, R Zhang, M Porter, Q Song… - … on Power Electronics, 2023 - ieeexplore.ieee.org
Gallium nitride (GaN) devices are revolutionarily advancing the efficiency, frequency, and
form factor of power electronics. However, the material composition, architecture, and …

Characterization of electrical switching safe operation area on Schottky-type p-GaN gate HEMTs

Y Huang, Q Jiang, S Huang, X Wang… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Gallium nitride (GaN) high electron mobility transistors (HEMTs) have demonstrated their
superior performance in consumer electronics. However, their longer-lifetime-demanding …

Ultra-Wideband Contactless Current Sensors for Power Electronics Applications

AP Sirat - 2023 - search.proquest.com
Enhanced power density factors can be achieved in the new generation of power electronics
by utilizing wide-bandgap semiconductor switching devices with higher switching speeds …

Reliability assessment for dual-active-bridge converter with fault tolerant capability

Y Zhu, H Wen, Q Bu, G Chu… - 2022 IEEE IAS Global …, 2022 - ieeexplore.ieee.org
Currently, dual-active-bridge (DAB) converters are widely adopted as the power interface to
achieve a bidirectional power flow and galvanic isolation in high-frequency dc power …

Design rules to establish a credible More‐Electric Engine baseline power architecture concept

Q Zhang, P Norman, G Burt - IET Electrical Systems in …, 2023 - Wiley Online Library
Abstract The More‐Electric Engine (MEE), with its electrified engine auxiliary systems and
increased multi‐shaft power offtake, is likely to become an increasingly central aspect of …

Improved power semiconductor dynamic testing circuit to suppress leakage current

X Hui, P Ning, D Zheng, T Fan… - IEEE Journal of …, 2024 - ieeexplore.ieee.org
Double pulse testing (DPT) is widely used for dynamic performance testing of power
semiconductors, as it can quickly obtain dynamic characterization parameters. In recent …

Loss Measurement of Low RDS Devices Through Thermal Modelling - The Advantage of Not Turning it Fully On

JM Sanz-Alcaine, FJ Perez-Cebolla… - 2023 25th European …, 2023 - ieeexplore.ieee.org
This paper presents and evaluates a novel method for generating power losses on
transistors avoiding high currents. These could heat up the circuit tracks, affecting the …

10 MHz-Switching on GaN Trench CAVET up to 300° C Operation Enabled by High Channel Mobility

X Wen, B Shankar, K Lee, H Kasai… - IEEE Electron …, 2024 - ieeexplore.ieee.org
High-frequency, up to 10 MHz, switching of normally-on GaN trench CAVETs was
demonstrated using an on-wafer double pulse test (DPT) system, along with high …

Test Setup to Study Threshold Voltage Shift of GaN-HEMTs Under Short-and Long-Term Gate and Drain Bias

B Kohlhepp, D Breidenstein… - IEEE Journal of Emerging …, 2024 - ieeexplore.ieee.org
GaN-HEMTs offer low on-state resistance and fast switching transitions. Thus, these devices
represent attractive candidates to build high efficient power converters with high power …

Impact of P-GaN ohmic contact resistivity on switching time of GaN super-heterojunction FETs

Y Du, J Kemmerling, J Song… - 2024 Device …, 2024 - ieeexplore.ieee.org
Gallium nitride (GaN) Super-Heterojunction FET (SHJ-FET) utilizes a charge-balanced PN
heterojunction, instead of a field-plate structure, to manage the E-field profile between the …