We propose a Built-In Self-Test (BIST) paradigm for analog and mixed-signal (A/MS)
Integrated Circuits (ICs), called symmetry-based BIST (SymBIST). SymBIST exploits inherent …

We discuss the state-of-the-art on fault diagnosis for analog circuits with a focus on
techniques that leverage machine learning. For a chip that has failed either in post …

The role of nano-electronic systems is rapidly expanding in every facet of modern life.
Testing the analog, mixed-signal, and RF (AMS/RF) functions of such systems is considered …

Integrated circuits (ICs) are fabricated using a series of photolithographic, printing, etching,
implanting, and chemical vapor deposition steps. This process is subject to imperfections …

The number of integrated circuits (ICs) used in safety-and mission-critical applications is
ever increasing. These applications demand that ICs carry functional safety properties. In …

Measurement and calibration of an analog-to-digital converter (ADC) using a histogram-
based method requires a large volume of data and a long test duration, especially for a high …

The measurement of static test parameters for an analog-todigital converter (ADC) requires
a large volume of test data, especially for a high-resolution ADC. This paper proposes a …