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Design and evaluation of multiple valued logic gates using pseudo N-type carbon nanotube FETs
Multiple valued logic (MVL) circuits are particularly attractive for nanoscale implementation
as advantages in information density and operating speed can be harvested using emerging …
as advantages in information density and operating speed can be harvested using emerging …
Variability and reliability analysis of CNFET technology: Impact of manufacturing imperfections
Carbon nanotube field-effect transistors (CNFETs) are promising candidates to substitute
silicon transistors. Boasting extraordinary electronic properties, CNFETs exhibit …
silicon transistors. Boasting extraordinary electronic properties, CNFETs exhibit …
A multi-sample, multi-tree approach to bag-of-words image representation for image retrieval
The state-of-the-art content based image retrieval systems has been significantly advanced
by the introduction of SIFT features and the bag-of-words image representation. Converting …
by the introduction of SIFT features and the bag-of-words image representation. Converting …
A transistor-level probabilistic approach for reliability analysis of arithmetic circuits with applications to emerging technologies
B Srinivasu, K Sridharan - IEEE Transactions on Reliability, 2017 - ieeexplore.ieee.org
Several field-effect transistor (FET)-based device technologies are emerging as powerful
alternatives to the classical metal oxide semiconductor FET (mosfet) for computing …
alternatives to the classical metal oxide semiconductor FET (mosfet) for computing …
Comparison of variations in MOSFET versus CNFET in gigascale integrated systems
Using previously developed model for CNT density variation in CNFETs and random dopant
fluctuation model in MOSFET, we compared and presented overall device variations in …
fluctuation model in MOSFET, we compared and presented overall device variations in …
Failure characterization of carbon nanotube FETs under process variations: Technology scaling issues
B Ghavami, M Raji - IEEE Transactions on Device and Materials …, 2016 - ieeexplore.ieee.org
Carbon nanotube field-effect transistors (CNFETs), consisting of aligned semiconducting
single-walled carbon nanotubes (CNTs), are promising nanoscale devices for …
single-walled carbon nanotubes (CNTs), are promising nanoscale devices for …
Optimum reliability sizing for complementary metal oxide semiconductor gates
Introducing redundancy at the device-level has been proposed as the most effective way to
improve reliability. With the remarkable reliability of the complementary metal oxide …
improve reliability. With the remarkable reliability of the complementary metal oxide …
Statistical functional yield estimation and enhancement of CNFET-based VLSI circuits
Carbon nanotube field effect transistors (CNFETs) show great promise as extensions to
silicon CMOS. However, imperfections, which are mainly related to carbon nanotubes …
silicon CMOS. However, imperfections, which are mainly related to carbon nanotubes …
Prediction of gate delay variation for CNFET under CNT density variation
This paper presents an analytical model for prediction of gate-delay variation in CNFETs that
is caused by CNT density variation. The analytical gate-delay variation model is derived …
is caused by CNT density variation. The analytical gate-delay variation model is derived …
Variation-aware global placement for improving timing-yield of carbon-nanotube field effect transistor circuit
As the conventional silicon-based CMOS technology marches toward the sub-10nm region,
the problem of high power density becomes increasingly serious. Under this circumstance …
the problem of high power density becomes increasingly serious. Under this circumstance …