Design and evaluation of multiple valued logic gates using pseudo N-type carbon nanotube FETs

J Liang, L Chen, J Han… - IEEE transactions on …, 2014 - ieeexplore.ieee.org
Multiple valued logic (MVL) circuits are particularly attractive for nanoscale implementation
as advantages in information density and operating speed can be harvested using emerging …

Variability and reliability analysis of CNFET technology: Impact of manufacturing imperfections

CG Almudever, A Rubio - Microelectronics Reliability, 2015 - Elsevier
Carbon nanotube field-effect transistors (CNFETs) are promising candidates to substitute
silicon transistors. Boasting extraordinary electronic properties, CNFETs exhibit …

A multi-sample, multi-tree approach to bag-of-words image representation for image retrieval

Z Wu, Q Ke, J Sun, HY Shum - 2009 IEEE 12th International …, 2009 - ieeexplore.ieee.org
The state-of-the-art content based image retrieval systems has been significantly advanced
by the introduction of SIFT features and the bag-of-words image representation. Converting …

A transistor-level probabilistic approach for reliability analysis of arithmetic circuits with applications to emerging technologies

B Srinivasu, K Sridharan - IEEE Transactions on Reliability, 2017 - ieeexplore.ieee.org
Several field-effect transistor (FET)-based device technologies are emerging as powerful
alternatives to the classical metal oxide semiconductor FET (mosfet) for computing …

Comparison of variations in MOSFET versus CNFET in gigascale integrated systems

AAM Shahi, P Zarkesh-Ha… - … Symposium on Quality …, 2012 - ieeexplore.ieee.org
Using previously developed model for CNT density variation in CNFETs and random dopant
fluctuation model in MOSFET, we compared and presented overall device variations in …

Failure characterization of carbon nanotube FETs under process variations: Technology scaling issues

B Ghavami, M Raji - IEEE Transactions on Device and Materials …, 2016 - ieeexplore.ieee.org
Carbon nanotube field-effect transistors (CNFETs), consisting of aligned semiconducting
single-walled carbon nanotubes (CNTs), are promising nanoscale devices for …

Optimum reliability sizing for complementary metal oxide semiconductor gates

W Ibrahim, V Beiu, A Beg - IEEE Transactions on Reliability, 2012 - ieeexplore.ieee.org
Introducing redundancy at the device-level has been proposed as the most effective way to
improve reliability. With the remarkable reliability of the complementary metal oxide …

Statistical functional yield estimation and enhancement of CNFET-based VLSI circuits

B Ghavami, M Raji, H Pedram… - IEEE transactions on …, 2012 - ieeexplore.ieee.org
Carbon nanotube field effect transistors (CNFETs) show great promise as extensions to
silicon CMOS. However, imperfections, which are mainly related to carbon nanotubes …

Prediction of gate delay variation for CNFET under CNT density variation

AAM Shahi, P Zarkesh-Ha - … on Defect and Fault Tolerance in …, 2012 - ieeexplore.ieee.org
This paper presents an analytical model for prediction of gate-delay variation in CNFETs that
is caused by CNT density variation. The analytical gate-delay variation model is derived …

Variation-aware global placement for improving timing-yield of carbon-nanotube field effect transistor circuit

C Wang, Y Sun, S Hu, L Jiang, W Qian - ACM Transactions on Design …, 2018 - dl.acm.org
As the conventional silicon-based CMOS technology marches toward the sub-10nm region,
the problem of high power density becomes increasingly serious. Under this circumstance …