Transistor self-heating-aware synthesis for reliable digital circuit designs
With the continuous scaling in technology nodes, the transistor self-heating effect (SHE)
emerges as a growing threat to circuit reliability. Increasingly confined transistor structures …
emerges as a growing threat to circuit reliability. Increasingly confined transistor structures …
Electrothermal Modeling of Multi-Nanosheet FETs With Various Layouts
W Kwon, C Yoo, J Jeon - IEEE Transactions on Electron …, 2024 - ieeexplore.ieee.org
In this study, we propose a highly accurate and rapidly analyzable electrothermal modeling
for the observed self-heating effect (SHE) characteristics in multinanosheet FETs (mNS …
for the observed self-heating effect (SHE) characteristics in multinanosheet FETs (mNS …
Study of non-diffusive thermal behaviors in nanoscale transistors under different heating strategies
Understanding the phonon transport mechanisms and efficiently capturing the
spatiotemporal distributions of temperature is of great significance for alleviating hotspot …
spatiotemporal distributions of temperature is of great significance for alleviating hotspot …
Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor
In ever-shrinking technology nodes, where transistor 3D structures become increasingly
confined and their features verge on the atomic scale, the phenomena of aging and self …
confined and their features verge on the atomic scale, the phenomena of aging and self …
Self-Heating Effect Analysis and Characterization of 6T SRAM Based on Delay Variation
Y Wang, H Liang, S Wang, H Zhang… - … on Electron Devices, 2024 - ieeexplore.ieee.org
With the introduction of FinFET transistors, the self-heating effect (SHE) became a major
reliability challenge. This leads to accelerated defect generation and, if not considered …
reliability challenge. This leads to accelerated defect generation and, if not considered …
Minimizing PVT-Variability by Exploiting the Zero Temperature Coefficient (ZTC) for Robust Delay Fault Testing
Process, Voltage, Temperature (PVT) variations impede the test generation for Small Delay
Faults (SDFs) significantly as test patterns effective for one circuit instance may not be valid …
Faults (SDFs) significantly as test patterns effective for one circuit instance may not be valid …
On the Severity of Self-Heating in FDSOI at Cryogenic Temperatures: In-depth Analysis from Transistors to Full Processor
Cryogenic CMOS devices face the challenge of excessive self-heating (SH), which has
emerged as a major concern for quantum computing (QC). This work is the first to reveal the …
emerged as a major concern for quantum computing (QC). This work is the first to reveal the …
Accelerating Device-Circuit Self-Heating Simulations with Dynamic Time Evolution for GAAFET
An accelerated self-heating effect (SHE) simulation methodology is presented for 3nm Gate-
all-around field effect transistors (GAAFETs), which, in combination with a compact thermal …
all-around field effect transistors (GAAFETs), which, in combination with a compact thermal …
[PDF][PDF] Design for Testing and Reliability in the Presence of Transistor Self-Heating for Advanced Technologies
F Klemme - 2022 - gs-imtr.uni-stuttgart.de
This report gives a comprehensive summary of the state of GS-IMTR project 9 (P9)“Design
for Testing and Reliability in the Presence of Transistor Self-Heating for Advanced …
for Testing and Reliability in the Presence of Transistor Self-Heating for Advanced …
Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level
Due to technology scaling in modern computing platforms, the safety and reliability issues
have increased tremendously, which often accelerate aging, lead to permanent faults, and …
have increased tremendously, which often accelerate aging, lead to permanent faults, and …