We investigated electron-beam lithography with an aberration-corrected scanning
transmission electron microscope. We achieved 2 nm isolated feature size and 5 nm half …

Electron beam techniques are indispensable tools for the analysis of surfaces in
fundamental as well as applied fields of science and technology. Significant improvements …

The recent development of double photoemission (DPE) spectroscopy at surfaces using
laser-based high-order harmonic generation in combination with time-of-flight electron …

This book presents the state of the art of the synthesis of materials, composites, and
chemical compounds, and describes methods based on the use of ionizing radiation. It is …

An investigation of the optical and electronic properties of amorphous silicon dioxide by
means of a combination of reflection electron energy loss spectroscopy (REELS) and …

Spectroscopy of correlated electron pairs was employed to investigate the energy
dissipation process, as well as the transport and the emission of low-energy electrons on a …

More than a century after the discovery of the electron, there are still fundamental, yet
unresolved, questions concerning the generation-ejection mechanism of the ubiquitous …

This paper demonstrates how secondary electron energy spectroscopy (SEES) performed
inside a scanning electron microscope (SEM) can be used to map sample atomic number …

The electron emission under electron impact between 10 eV and 2 keV is investigated with a
Monte Carlo (MC) code in aluminum, silver, and silicon. The code is based on the complex …

A Monte Carlo simulation method for study of electron-solid interaction based on modeling
of cascade secondary electron (SE) production and transportation has been used to …