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Gallium nitride material devices including an electrode-defining layer and methods of forming the same
(54) GALLIUM NITRIDE MATERIAL DEVICES 5,296,395 A 3, 1994 Khan et al. INCLUDING
AN ELECTRODE-DEFINING 5,389,571 A 2f1995 Takeuchi et al. LAYER AND METHODS …
AN ELECTRODE-DEFINING 5,389,571 A 2f1995 Takeuchi et al. LAYER AND METHODS …
Semiconductor device-based sensors
4411, 741. A 10/1983 Janata associated with the same are provided. The sensors include
4,636,827 A 1, 1987 Rudolf regions that can interact with chemical species being 4, 791465 …
4,636,827 A 1, 1987 Rudolf regions that can interact with chemical species being 4, 791465 …
Gallium nitride-on-silicon interface using multiple aluminum compound buffer layers
T Li, DJ Tweet, J Maa, ST Hsu - US Patent 7,598,108, 2009 - Google Patents
As noted above, the current best large-area GaN films are grown on Sapphire Substrates.
But, state-of-the-art Sapphire substrate size is relatively small and expensive. Further, the …
But, state-of-the-art Sapphire substrate size is relatively small and expensive. Further, the …
III-nitride material structures including silicon substrates
AW Hanson, JC Roberts, EL Piner… - US Patent …, 2007 - Google Patents
Ill-nitride material structures including silicon substrates, as Well as methods associated
With the same, are described. Parasitic losses in the structures may be signi? cantly reduced …
With the same, are described. Parasitic losses in the structures may be signi? cantly reduced …
Method for heteroepitaxial growth of high-quality N-face GaN, InN, and AIN and their alloys by metal organic chemical vapor deposition
(54) METHOD FOR HETEROEPITAXIAL 6,051,849 A 4/2000 Davis et a1. GROWTH OF
HIGH-QUALITY N-FACE GAN, 6,064,078 A 5/2000 Northrup et a1, INN, AND AIN AND …
HIGH-QUALITY N-FACE GAN, 6,064,078 A 5/2000 Northrup et a1, INN, AND AIN AND …
Method of controlling stress in gallium nitride films deposited on substrates
H Marchand, BJ Moran - US Patent 7,687,888, 2010 - Google Patents
Methods of controlling stress in GaN? lms deposited on silicon and silicon carbide
substrates and the? lms produced therefrom are disclosed. A typical method comprises …
substrates and the? lms produced therefrom are disclosed. A typical method comprises …
Gallium nitride materials and methods
T Weeks, E Piner, T Gehrke… - US Patent App. 10 …, 2004 - Google Patents
The invention provides Semiconductor materials including a gallium nitride material layer
formed on a Silicon Substrate and methods to form the Semiconductor materials. The …
formed on a Silicon Substrate and methods to form the Semiconductor materials. The …
Gallium nitride materials and methods associated with the same
EL Piner, JC Roberts, P Rajagopal - US Patent 7,339,205, 2008 - Google Patents
Semiconductor materials including a gallium nitride mate rial region and methods
associated With such structures are provided. The semiconductor structures include a strain …
associated With such structures are provided. The semiconductor structures include a strain …
Gallium nitride material structures including isolation regions and methods
J Johnson, R Borges, J Brown, J Cook… - US Patent App. 10 …, 2005 - Google Patents
Gallium nitride material Structures, including devices, and methods associated with the
same are provided. In Some embodiments, the Structures include one or more isolation …
same are provided. In Some embodiments, the Structures include one or more isolation …
Gallium nitride material transistors and methods associated with the same
WH Nagy, RM Borges, JD Brown… - US Patent …, 2006 - Google Patents
Gallium nitride materials include gallium nitride (GaN) and its alloys such as aluminum
gallium nitride (AlGaN), indium gallium nitride (InGaN), and aluminum indium gallium nitride …
gallium nitride (AlGaN), indium gallium nitride (InGaN), and aluminum indium gallium nitride …