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Scaling the effective area of higher-order-mode erbium-doped fiber amplifiers
We demonstrate scaling of the effective area of higher-order mode, Er-doped fiber
amplifiers. Two Er-doped higher-order mode fibers, one with 3800 μm^ 2 A_eff in the LP_0 …
amplifiers. Two Er-doped higher-order mode fibers, one with 3800 μm^ 2 A_eff in the LP_0 …
Self-test and diagnosis for self-aware systems
Self-testing hardware has a long tradition as a complement to manufacturing testing based
on test stimuli and response analysis. Today, it is a mature field and many complex SoCs …
on test stimuli and response analysis. Today, it is a mature field and many complex SoCs …
A secure DFT architecture protecting crypto chips against scan-based attacks
W Wang, J Wang, W Wang, P Liu, S Cai - IEEE Access, 2019 - ieeexplore.ieee.org
Scan design is a widely used design-for-test methodology since it enhances the
controllability and observability of integrated circuits significantly. However, it may become a …
controllability and observability of integrated circuits significantly. However, it may become a …
[HTML][HTML] Understanding multidimensional verification: Where functional meets non-functional
Advancements in electronic systems' design have a notable impact on design verification
technologies. The recent paradigms of Internet-of-Things (IoT) and Cyber-Physical Systems …
technologies. The recent paradigms of Internet-of-Things (IoT) and Cyber-Physical Systems …
Device aging: A reliability and security concern
Device aging is an important concern in nanoscale designs. Due to aging the electrical
behavior of transistors embedded in an integrated circuit deviates from original intended …
behavior of transistors embedded in an integrated circuit deviates from original intended …
Trustworthy reconfigurable access to on-chip infrastructure
The accessibility of on-chip embedded infrastructure for test, reconfiguration, or debug
poses a serious security problem. Access mechanisms based on IEEE Std 1149.1 (JTAG) …
poses a serious security problem. Access mechanisms based on IEEE Std 1149.1 (JTAG) …
On secure data flow in reconfigurable scan networks
P Raiola, B Thiemann, J Burchard… - … , Automation & Test …, 2019 - ieeexplore.ieee.org
Reconfigurable Scan Networks (RSNs) allow flexible access to embedded instruments for
post-silicon test, validation and debug or diagnosis. The increased observability and …
post-silicon test, validation and debug or diagnosis. The increased observability and …
Towards multidimensional verification: Where functional meets non-functional
Trends in advanced electronic systems' design have a notable impact on design verification
technologies. The recent paradigms of Internet-of-Things (IoT) and CyberPhysical Systems …
technologies. The recent paradigms of Internet-of-Things (IoT) and CyberPhysical Systems …
Online prevention of security violations in reconfigurable scan networks
Modern systems-on-chip (SoC) designs are requiring more and more infrastructure for
validation, debug, volume test as well as in-field maintenance and repair. Reconfigurable …
validation, debug, volume test as well as in-field maintenance and repair. Reconfigurable …
Detecting and resolving security violations in reconfigurable scan networks
Reconfigurable Scan Networks (RSNs) allow flexible access to embedded instruments for
post-silicon validation and debug or diagnosis. However, this scan infrastructure can also be …
post-silicon validation and debug or diagnosis. However, this scan infrastructure can also be …