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A multi-state model for transmission system resilience enhancement against short-circuit faults caused by extreme weather events
Due to global climate change, the effect of extreme weather on power systems has attracted
extensive attention. In the prior-art grid resilience studies, the hurricanes or wildfires are …
extensive attention. In the prior-art grid resilience studies, the hurricanes or wildfires are …
An aging-resistant RO-PUF for reliable key generation
Physical unclonable functions (PUFs) have emerged as a promising security primitive for
low-cost authentication and cryptographic key generation. However, PUF stability with …
low-cost authentication and cryptographic key generation. However, PUF stability with …
Self-tuning for maximized lifetime energy-efficiency in the presence of circuit aging
E Mintarno, J Skaf, R Zheng… - … on Computer-Aided …, 2011 - ieeexplore.ieee.org
This paper presents an integrated framework, together with control policies, for optimizing
dynamic control of self-tuning parameters of a digital system over its lifetime in the presence …
dynamic control of self-tuning parameters of a digital system over its lifetime in the presence …
Workload dependent NBTI and PBTI analysis for a sub-45nm commercial microprocessor
This paper analyzes aging effects on various design hierarchies of a sub-45nm commercial
processor running realistic applications. Dependencies of aging effects on switching-activity …
processor running realistic applications. Dependencies of aging effects on switching-activity …
Robust system design to overcome CMOS reliability challenges
Today's mainstream electronic systems typically assume that transistors and interconnects
operate correctly over their useful lifetime. With enormous complexity and significantly …
operate correctly over their useful lifetime. With enormous complexity and significantly …
An ultra-low power, reconfigurable, aging resilient RO PUF for IoT applications
Abstract Physically Unclonable Functions (PUF) have emerged as security primitives which
can generate high entropy, temper resilient bits for security applications. However, the …
can generate high entropy, temper resilient bits for security applications. However, the …
Testing for transistor aging
AH Baba, S Mitra - 2009 27th IEEE VLSI Test Symposium, 2009 - ieeexplore.ieee.org
Transistor aging results in circuit delay degradation over time, and is a growing concern for
future systems. On-line circuit failure prediction, together with on-line self-test, can overcome …
future systems. On-line circuit failure prediction, together with on-line self-test, can overcome …
Aging benefits in nanometer CMOS designs
In this brief, we show that bias temperature instability (BTI) aging of MOS transistors,
together with its detrimental effect for circuit performance and lifetime, presents considerable …
together with its detrimental effect for circuit performance and lifetime, presents considerable …
Low cost NBTI degradation detection and masking approaches
Performance degradation of integrated circuits due to aging effects, such as Negative Bias
Temperature Instability (NBTI), is becoming a great concern for current and future CMOS …
Temperature Instability (NBTI), is becoming a great concern for current and future CMOS …
Impact of bias temperature instability on soft error susceptibility
In this paper, we address the issue of analyzing the effects of aging mechanisms on ICs' soft
error (SE) susceptibility. In particular, we consider bias temperature instability (BTI), namely …
error (SE) susceptibility. In particular, we consider bias temperature instability (BTI), namely …