Macro cell based process design kit for advanced applications
HY Lee, CW Chang, JF Kuan, WS Chou - US Patent 8,701,055, 2014 - Google Patents
BACKGROUND The semiconductor industry has experienced rapid growth due to
continuous improvements in the integration density of various electronic components (eg …
continuous improvements in the integration density of various electronic components (eg …
Method of generating techfile having reduced corner variation value
CH Wang, KH Tam, YP Chen, WH Chen… - US Patent …, 2016 - Google Patents
Filed: Jul. 30, 2014 A method of generating a techfile corresponding to a pre (65) Prior
Publication Data determined fabrication process is disclosed. The method includes …
Publication Data determined fabrication process is disclosed. The method includes …
Topography driven OPC and lithography flow
U Katakamsetty, Q Yang, WK Yeo, CW Hui… - US Patent …, 2015 - Google Patents
Enhancements in lithography for forming an integrated circuit are disclosed. The
enhancements include a topography analysis of a design data file to obtain accumulative …
enhancements include a topography analysis of a design data file to obtain accumulative …
Facilitation of spin-coat planarization over feature topography during substrate fabrication
RL Burns, BM Rathsack, MH Somervell… - US Patent …, 2020 - Google Patents
Described herein are technologies to facilitate device fabri cation, especially those that
involve spin-on coatings of a substrate (eg, wafer). More particularly, technologies described …
involve spin-on coatings of a substrate (eg, wafer). More particularly, technologies described …
Surface topography enhanced pattern (STEP) matching
VB Perez, U Katakamsetty, WK Yeo - US Patent 9,026,954, 2015 - Google Patents
(57) ABSTRACT A design or lithographic enhancement process, a method for forming a
device based on the lithographic enhancement process and a system for pattern …
device based on the lithographic enhancement process and a system for pattern …
Integrated circuit design and fabrication method by way of detecting and scoring hotspots
HM Hou, JF Kung - US Patent 8,434,030, 2013 - Google Patents
In accordance with an aspect, the present invention pro vides an integrated circuit design
and fabrication method. The integrated circuit design and fabrication method includes the …
and fabrication method. The integrated circuit design and fabrication method includes the …
Method and apparatus for low power semiconductor chip layout and low power semiconductor chip
CP Jou, LIN Ming-Tsun, FL Hsueh, ST Juang - US Patent 8,539,388, 2013 - Google Patents
A layout system is described comprising a layout unit configured to layout cells in a mask
design for a semiconductor chip based on library cells for a specified process node; a non …
design for a semiconductor chip based on library cells for a specified process node; a non …
Measuring and modeling material planarization performance
R Lallement, SA Sieg - US Patent 10,832,919, 2020 - Google Patents
A method for modeling planarization performance of a given material includes patterning a
first photoresist layer over a first material deposited over a substrate. The method also …
first photoresist layer over a first material deposited over a substrate. The method also …
Estimation of power and thermal profiles
WM Hogan - US Patent 9,183,330, 2015 - Google Patents
Process Scaling and rising device density increase power density and thermal effects for
integrated circuits. Increased power consumption and temperature may affect integrated …
integrated circuits. Increased power consumption and temperature may affect integrated …
Determination of optical roughness in EUV structures
G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original
having an opaque pattern on a transparent support, eg film printing, projection printing; by …
having an opaque pattern on a transparent support, eg film printing, projection printing; by …