Recent progress in high performance and reliable n-type transition metal oxide-based thin film transistors

JY Kwon, JK Jeong - Semiconductor Science and Technology, 2015 - iopscience.iop.org
This review gives an overview of the recent progress in vacuum-based n-type transition
metal oxide (TMO) thin film transistors (TFTs). Several excellent review papers regarding …

[HTML][HTML] Recent advances of In2O3-based thin-film transistors: A review

BK Yap, Z Zhang, GSH Thien, KY Chan… - Applied Surface Science …, 2023 - Elsevier
The electronics industry has witnessed a surge in demand for semiconductor materials,
prompting researchers to explore active semiconductors that can effectively meet the …

Review of material properties of oxide semiconductor thin films grown by atomic layer deposition for next-generation 3D dynamic random-access memory devices

AR Choi, DH Lim, SY Shin, HJ Kang, D Kim… - Chemistry of …, 2024 - ACS Publications
Dynamic random-access memory (DRAM) devices are essential volatile memory
components in most digital devices. With the increasing demand for further low-power and …

Transparent p-type SnOx thin film transistors produced by reactive rf magnetron sputtering followed by low temperature annealing

E Fortunato, R Barros, P Barquinha… - Applied Physics …, 2010 - pubs.aip.org
P-type thin-film transistors (TFTs) using room temperature sputtered SnO x (x< 2) as a
transparent oxide semiconductor have been produced. The SnO x films show p-type …

Low‐temperature, nontoxic water‐induced metal‐oxide thin films and their application in thin‐film transistors

G Liu, A Liu, H Zhu, B Shin, E Fortunato… - Advanced Functional …, 2015 - Wiley Online Library
Here, a simple, nontoxic, and inexpensive “water‐inducement” technique for the fabrication
of oxide thin films at low annealing temperatures is reported. For water‐induced (WI) …

P‐29: Modeling of Amorphous Oxide Semiconductor Thin Film Transistors and Subgap Density of States

HH Hsieh, T Kamiya, K Nomura… - … Symposium Digest of …, 2008 - Wiley Online Library
We report a model of the carrier transport and the subgap density of states in a
representative amorphous oxide semiconductor, amorphous InGaZnO4 (a‐IGZO), for device …

Modeling of amorphous InGaZnO4 thin film transistors and their subgap density of states

HH Hsieh, T Kamiya, K Nomura, H Hosono… - Applied Physics …, 2008 - pubs.aip.org
We report a model of the carrier transport and the subgap density of states in amorphous In
Ga Zn O 4 (⁠ a-IGZO) for device simulation of a-IGZO thin-film transistors (TFTs) operated in …

High-mobility low-voltage ZnO and Li-doped ZnO transistors based on ZrO2 high-k dielectric grown by spray pyrolysis in ambient air

G Adamopoulos, S Thomas… - Advanced …, 2011 - faculty.kaust.edu.sa
Sequential layers of the high-k dielectric ZrO 2 and the electron transporting semiconductors
ZnO and Li-doped ZnO are deposited onto conductive indium tin oxide electrodes using …

High-performance solution-processed amorphous zinc− indium− tin oxide thin-film transistors

MG Kim, HS Kim, YG Ha, J He… - journal of the …, 2010 - ACS Publications
Films of the high-performance solution-processed amorphous oxide semiconductor a-
ZnIn4Sn4O15, grown from 2-methoxyethanol/ethanolamine solutions, were used to fabricate …

High‐mobility ZnO thin film transistors based on solution‐processed hafnium oxide gate dielectrics

M Esro, G Vourlias, C Somerton… - Advanced Functional …, 2015 - Wiley Online Library
The properties of metal oxides with high dielectric constant (k) are being extensively studied
for use as gate dielectric alternatives to silicon dioxide (SiO2). Despite their attractive …