[HTML][HTML] Low-voltage SEM of air-sensitive powders: From sample preparation to micro/nano analysis with secondary electron hyperspectral imaging

JF Nohl, NTH Farr, Y Sun, GM Hughes, SA Cussen… - Micron, 2022 - Elsevier
Powder materials are used in all corners of materials science, from additive manufacturing to
energy storage. Scanning electron microscopy (SEM) has developed to meet morphological …

An extensive theoretical quantification of secondary electron emission from silicon

MSS Khan, SF Mao, YB Zou, DB Lu, B Da, YG Li… - Vacuum, 2023 - Elsevier
Though intensive experimental studies have been carried out on electron emission
properties in past decades, the reliable data from accurate experimental measurements for …

[HTML][HTML] Determination of electron backscattering coefficient of beryllium by a high-precision Monte Carlo simulation

A Hussain, L Yang, S Mao, B Da, K Tőkési… - Nuclear Materials and …, 2021 - Elsevier
We present an up-to-date Monte Carlo simulation of electron backscattering coefficient of
beryllium, which is an important material in fusion reactor, at an impact energy range of …

Monte Carlo simulation study of electron yields from compound semiconductor materials

A Hussain, LH Yang, YB Zou, SF Mao, B Da… - Journal of Applied …, 2020 - pubs.aip.org
A systematic study has been performed based on a Monte Carlo simulation for the
investigation of secondary electron yields, backscattering coefficients, and total electron …

Evaluation of dielectric function models for calculation of electron inelastic mean free path

B Da, X Liu, LH Yang, JM Gong, ZJ Ding… - Journal of Applied …, 2022 - pubs.aip.org
This work investigates the detailed difference between dielectric function models, the
Mermin model and the full Penn algorithm (FPA) model, for the determination of an electron …

Access to ultrafast surface and interface carrier dynamics simultaneously in space and time

J Zhao, R Nughays, OM Bakr… - The Journal of Physical …, 2021 - ACS Publications
Charge carrier dynamics at material surfaces and interfaces play a fundamental role in
controlling the performance of photocatalytic reactions and photovoltaic devices; however …

Ensemble machine learning methods: predicting electron stop** powers from a small experimental database

LH Yang, B Da, ZJ Ding - Physical Chemistry Chemical Physics, 2021 - pubs.rsc.org
Electron stop** power (SP) is of great importance in theoretical and applied research
areas specifically for Monte Carlo simulation studies in many microanalysis and surface …

Suppression of Secondary Electron Emission from Nickel Surface by Graphene Composites Based on First-Principles Method

M Peng, C Nan, D Wang, M Cao, L Zhang, L Liu, C Liu… - Nanomaterials, 2023 - mdpi.com
Secondary electron emission (SEE) is a fundamental phenomenon of particle/surface
interaction, and the multipactor effect induced by SEE can result in disastrous impacts on the …

Theoretical perspective of atomic resolution secondary electron imaging

L Cheng, L Yang, R Zeng, Y Ming, B Da… - The Journal of Physical …, 2021 - ACS Publications
Atomic resolution secondary electron imaging (ARSEI) has become an alternative tool for
material characterization; however, its application potential is still underestimated due to …

The role of primary and secondary electrons in scanning transmission electron microscopy of hybrid perovskites: the CsPbBr case

PE Trevisanutto, S Taioli, M Dapor, CS Allen… - arxiv preprint arxiv …, 2024 - arxiv.org
High-resolution imaging has revolutionized materials science by offering detailed insights
into the atomic structures of materials. Electron microscopy and spectroscopy rely on …