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Trends in semiconductor defect engineering at the nanoscale
EG Seebauer, KW Noh - Materials Science and Engineering: R: Reports, 2010 - Elsevier
Defect engineering involves manipulating the type, concentration, spatial distribution, or
mobility of defects within a crystalline solid. Defect engineering in semiconductors has …
mobility of defects within a crystalline solid. Defect engineering in semiconductors has …
Multiscale modelling of irradiation in nanostructures
K Nordlund, F Djurabekova - Journal of Computational Electronics, 2014 - Springer
Ion and electron irradiation can be used to modify not only conventional materials such as
silicon, but also nanostructures. This opens up exciting possibilities for basic science studies …
silicon, but also nanostructures. This opens up exciting possibilities for basic science studies …
Evidence on the mechanism of boron deactivation in Ge-preamorphized ultrashallow junctions
BJ Pawlak, R Surdeanu, B Colombeau… - Applied Physics …, 2004 - pubs.aip.org
We investigate the thermal stability of boron-doped junctions formed by Ge
preamorphization and solid phase epitaxial regrowth. Isochronal annealing and …
preamorphization and solid phase epitaxial regrowth. Isochronal annealing and …
A physically based model for the spatial and temporal evolution of self-interstitial agglomerates in ion-implanted silicon
A physically motivated model that accounts for the spatial and temporal evolution of self-
interstitial agglomerates in ion-implanted Si is presented. For the calibration of the model, a …
interstitial agglomerates in ion-implanted Si is presented. For the calibration of the model, a …
Evolution of extended defects in polycrystalline Au-irradiated UO2 using in situ TEM: Temperature and fluence effects
C Onofri, C Sabathier, C Baumier, C Bachelet… - Journal of Nuclear …, 2016 - Elsevier
Abstract In situ Transmission Electron Microscopy irradiations were performed on
polycrystalline UO 2 thin foils with 4 MeV gold ions at three different temperatures: 600° C …
polycrystalline UO 2 thin foils with 4 MeV gold ions at three different temperatures: 600° C …
Extended defects formation in nanosecond laser-annealed ion implanted silicon
Damage evolution and dopant distribution during nanosecond laser thermal annealing of
ion implanted silicon have been investigated by means of transmission electron microscopy …
ion implanted silicon have been investigated by means of transmission electron microscopy …
Evaluation of implantation annealing for highly-doped selective boron emitters suitable for screen-printed contacts
R Müller, J Benick, N Bateman, J Schön… - Solar Energy Materials …, 2014 - Elsevier
Ion implantation is a technology suitable for the formation of high quality junctions in silicon
solar cell processing. As screen-printing is the state of the art metallization technique for …
solar cell processing. As screen-printing is the state of the art metallization technique for …
Amorphization, recrystallization and end of range defects in germanium
The controlled do** of germanium by ion implantation is a process which requires basic
research before optimization. For this reason, we have experimentally studied by …
research before optimization. For this reason, we have experimentally studied by …
Advanced activation of ultra-shallow junctions using flash-assisted RTP
W Lerch, S Paul, J Niess, S McCoy, T Selinger… - Materials Science and …, 2005 - Elsevier
A key issue associated with the continuous reduction of dimensions of CMOS transistors is
the realization of highly conductive, ultra-shallow junctions for source/drain extensions …
the realization of highly conductive, ultra-shallow junctions for source/drain extensions …
Clusters formation in ultralow-energy high-dose boron-implanted silicon
The formation and evolution of small cluster defects in 500 eV, 1× 10 15 cm− 2 boron-
implanted silicon is investigated. These clusters are identified by high-resolution …
implanted silicon is investigated. These clusters are identified by high-resolution …