Trends in semiconductor defect engineering at the nanoscale

EG Seebauer, KW Noh - Materials Science and Engineering: R: Reports, 2010 - Elsevier
Defect engineering involves manipulating the type, concentration, spatial distribution, or
mobility of defects within a crystalline solid. Defect engineering in semiconductors has …

Multiscale modelling of irradiation in nanostructures

K Nordlund, F Djurabekova - Journal of Computational Electronics, 2014 - Springer
Ion and electron irradiation can be used to modify not only conventional materials such as
silicon, but also nanostructures. This opens up exciting possibilities for basic science studies …

Evidence on the mechanism of boron deactivation in Ge-preamorphized ultrashallow junctions

BJ Pawlak, R Surdeanu, B Colombeau… - Applied Physics …, 2004 - pubs.aip.org
We investigate the thermal stability of boron-doped junctions formed by Ge
preamorphization and solid phase epitaxial regrowth. Isochronal annealing and …

A physically based model for the spatial and temporal evolution of self-interstitial agglomerates in ion-implanted silicon

CJ Ortiz, P Pichler, T Fühner, F Cristiano… - Journal of applied …, 2004 - pubs.aip.org
A physically motivated model that accounts for the spatial and temporal evolution of self-
interstitial agglomerates in ion-implanted Si is presented. For the calibration of the model, a …

Evolution of extended defects in polycrystalline Au-irradiated UO2 using in situ TEM: Temperature and fluence effects

C Onofri, C Sabathier, C Baumier, C Bachelet… - Journal of Nuclear …, 2016 - Elsevier
Abstract In situ Transmission Electron Microscopy irradiations were performed on
polycrystalline UO 2 thin foils with 4 MeV gold ions at three different temperatures: 600° C …

Extended defects formation in nanosecond laser-annealed ion implanted silicon

Y Qiu, F Cristiano, K Huet, F Mazzamuto, G Fisicaro… - Nano …, 2014 - ACS Publications
Damage evolution and dopant distribution during nanosecond laser thermal annealing of
ion implanted silicon have been investigated by means of transmission electron microscopy …

Evaluation of implantation annealing for highly-doped selective boron emitters suitable for screen-printed contacts

R Müller, J Benick, N Bateman, J Schön… - Solar Energy Materials …, 2014 - Elsevier
Ion implantation is a technology suitable for the formation of high quality junctions in silicon
solar cell processing. As screen-printing is the state of the art metallization technique for …

Amorphization, recrystallization and end of range defects in germanium

A Claverie, S Koffel, N Cherkashin, G Benassayag… - Thin Solid Films, 2010 - Elsevier
The controlled do** of germanium by ion implantation is a process which requires basic
research before optimization. For this reason, we have experimentally studied by …

Advanced activation of ultra-shallow junctions using flash-assisted RTP

W Lerch, S Paul, J Niess, S McCoy, T Selinger… - Materials Science and …, 2005 - Elsevier
A key issue associated with the continuous reduction of dimensions of CMOS transistors is
the realization of highly conductive, ultra-shallow junctions for source/drain extensions …

Clusters formation in ultralow-energy high-dose boron-implanted silicon

F Cristiano, X Hebras, N Cherkashin, A Claverie… - Applied physics …, 2003 - pubs.aip.org
The formation and evolution of small cluster defects in 500 eV, 1× 10 15 cm− 2 boron-
implanted silicon is investigated. These clusters are identified by high-resolution …