The creation of soft errors due to the propagation of single event transients (SETs) is a
significant reliability challenge in modern CMOS logic. SET concerns continue to be …

The aim of this review paper is to describe in a comprehensive manner the current
understanding of the radiation response of state-of-the-art Silicon-on-Insulator (SOI) and …

Advances in microelectronics performance and density continue to be fueled by the engine
of Moore's law. Although lately this engine appears to be running out of steam, recent …

An overview is presented of the significant influences of Moore's Law scaling on radiation
effects on microelectronics, focusing on historical trends and future needs. A number of …

The history of integrated circuit (IC) development is another record of human challenges
involving space. Efforts have been made to protect ICs from sudden malfunctions due to …

The application of pulsed lasers to the study of Single-Event Effects (SEEs) in integrated
circuits and devices is described. The role of a pulsed laser is to provide spatial and …

Estimation of soft error sensitivity is crucial in order to devise optimal mitigation solutions that
can satisfy reliability requirements with reduced impact on area, performance, and power …

The ability for Single Event Transients (SETs) to induce soft errors in Integrated Circuits (ICs)
was predicted for the first time by Wallmark and Marcus in the early 60's and was confirmed …

The propagation of single event transients (SET) is measured and modeled in SOI and bulk
inverter chains. The propagation-induced pulse broadening (PIPB) effect is shown to …

Heavy-ion microbeam and broadbeam data are presented for a 65 nm bulk CMOS process
showing the existence of pulse quenching at normal and angular incidence for designs …