Successive irradiation and bias temperature stress induced effects on commercial p-channel power VDMOS transistors

S Veljković, N Mitrović, V Davidović… - Facta universitatis …, 2024 - doiserbia.nb.rs
This study examines the effects of negative bias temperature (NBT) stress on irradiated
commercial p-channel power VDMOS transistors, with a focus on contribution to threshold …

Reducing Reservoir Dimensionality with Phase Space Construction for Simplified Hardware Implementation

Y Guo, R Degraeve, P Roussel, B Kaczer… - … Conference on Artificial …, 2024 - Springer
In this paper, we propose a One-Shot AI algorithm employing reservoir computing in
combination with Phase Space Reconstruction (PSR). Such a combination not only …

Ovonic Threshold Switching for Ultralow Energy Physical Reservoir Computing

YY Guo, R Degraeve, T Ravsher… - … on Electron Devices, 2025 - ieeexplore.ieee.org
In this article, we demonstrate physical reservoir computing (RC) in ovonic threshold
switching (OTS) devices. We show that SiGeAsSe OTS is suitable as a physical reservoir …