As the complexity of VLSI circuits is increasing due to the exponential rise in transistor count
per chip, testing cost is becoming an important factor in the overall integrated circuit (IC) …

Spin-Torque Transfer Random Access Memory (STTRAM) is a promising technology for
high density on-chip cache due to low standby power. Additionally, it offers fast access time …

Artificial intelligence (AI) and machine learning (ML) techniques have been increasingly
used in several fields to improve performance and the level of automation. In recent years …

The topic of this paper is Nenofex, a solver for quantified boolean formulae (QBF) in
negation normal form (NNF), which relies on expansion as the core technique for eliminating …

Three-dimensional stacked ICs (3D-SICs) based on Through-Silicon Vias (TSV) promise
high-performance low-power functionality in a smaller form factor at lower cost. Stacking …

Testing cost is becoming increasingly important as system-on-chip circuits continue to
become more complex. In this paper, we address the issue of reducing test cost by …

Testing of Memory cores has an important role in the process of testing System-on-Chip
(SoC) for detecting faults and improving overall yield and quality. Most common method …

Scan-based designs are widely used to decrease the complexity of the test generation
process; nonetheless, they increase test time and volume. A new scan architecture is …

The complexity and heterogeneity of digital devices used in embedded systems is
increasing everyday and delivering a bug-free design is still a very complex task. The …

As the complexity of VLSI circuits is increasing due to the exponential rise in transistor count
per chip, testing cost is becoming an important factor in the overall integrated circuit (IC) …