Temporal variability in phytodetritus and megabenthic activity at the seabed in the deep Northeast Atlantic

BJ Bett, MG Malzone, BE Narayanaswamy… - Progress in …, 2001 - Elsevier
We report a ten-year study of the abundance and activity of megabenthos on the Porcupine
Abyssal Plain, northeast Atlantic, together with observations on the occurrence of …

Automatic resource specification generation for resource selection

R Huang, H Casanova, AA Chien - Proceedings of the 2007 ACM/IEEE …, 2007 - dl.acm.org
With an increasing number of available resources in large-scale distributed environments, a
key challenge is resource selection. Fortunately, several middleware systems provide …

Validation vector grade (VVG): A new coverage metric for validation and test

PA Thaker, VD Agrawal… - Proceedings 17th IEEE …, 1999 - ieeexplore.ieee.org
Current code coverage metrics used in high level VLSI design methodology are based on
statement, branch, toggle and condition coverages of the HDL code obtained by simulating …

Concurrent error detection adder based on two paths output computation

C Khedhiri, M Karmani, B Hamdi… - 2011 IEEE Ninth …, 2011 - ieeexplore.ieee.org
This paper presents a concurrent error detection (CED) technique for a bit-slice of a full-
adder. The proposed method involves computing the sum and carry bits in two alternative …

A novel differential XOR-based self-checking adder

H Belgacem, K Chiraz, T Rached - International Journal of …, 2012 - Taylor & Francis
Self-checking designs will gain increasing interest in industrial applications if they satisfy the
following requirements: high fault coverage and reduced hardware cost with reduced design …

A self-healing real-time system based on run-time self-reconfiguration

MG Gericota, GR Alves… - 2005 IEEE Conference on …, 2005 - ieeexplore.ieee.org
The new generations of SRAM-based FPGA (field programmable gate array) devices are the
preferred choice for the implementation of reconfigurable computing platforms intended to …

[PDF][PDF] Pass transistor based self-checking full adder

H Belgacem, K Chiraz, T Rached - International Journal of Computer …, 2011 - academia.edu
Self-checking designs will gain increasing interest in industrial applications if they satisfy the
following requirements: high fault coverage and reduced hardware cost with reduced design …

On the design of self-checking controllers with datapath interactions

P Oikonomakos, M Zwolinski - IEEE Transactions on Computers, 2006 - ieeexplore.ieee.org
We consider the problem of designing self-checking controllers for controller/datapath
architectures. We introduce the concept of intrinsically secure states. We present six …

A Flexible Concurrent Testing Scheme for Non-Feedback and Feedback Bridging Faults in Integrated Circuits

PK Biswal - Journal of Electronic Testing, 2023 - Springer
This paper presents a novel flexible concurrent testing scheme for non-feedback and
feedback bridging faults in integrated circuits. All the existing concurrent testing schemes for …

Using high-level synthesis to implement on-line testability

P Oikonomakos, M Zwolinski - 2001 - eprints.soton.ac.uk
On-line testing increases system reliability, which is essential in a number of applications.
High-level synthesis, on the other hand, offers fast time-to-market and allows quick and …