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[KNIHA][B] Reliability, Availability and Serviceability of Networks-on-chip
É Cota, A de Morais Amory, MS Lubaszewski - 2011 - books.google.com
This book presents an overview of the issues related to the test, diagnosis and fault-
tolerance of Network on Chip-based systems. It is the first book dedicated to the quality …
tolerance of Network on Chip-based systems. It is the first book dedicated to the quality …
Exploiting network-on-chip structural redundancy for a cooperative and scalable built-in self-test architecture
A Strano, C Gómez, D Ludovici… - … , Automation & Test …, 2011 - ieeexplore.ieee.org
This paper proposes a built-in self-test/self-diagnosis procedure at start-up of an on-chip
network (NoC). Concurrent BIST operations are carried out after reset at each switch, thus …
network (NoC). Concurrent BIST operations are carried out after reset at each switch, thus …
On-line dependability enhancement of multiprocessor SoCs by resource management
TD Ter Braak, ST Burgess… - … on System on Chip, 2010 - ieeexplore.ieee.org
This paper describes a new approach towards dependable design of homogeneous multi-
processor SoCs in an example satellite-navigation application. First, the NoC dependability …
processor SoCs in an example satellite-navigation application. First, the NoC dependability …
Transaction-based online debug for NoC-based multiprocessor SoCs
M Dehbashi, G Fey - Microprocessors and Microsystems, 2015 - Elsevier
As complexity and size of Systems-on-Chip (SoC) grow, debugging becomes a bottleneck
for designing IC products. In this paper, we present an approach for online debug of NoC …
for designing IC products. In this paper, we present an approach for online debug of NoC …
Structural software-based self-test of network-on-chip
A Dalirsani, ME Imhof… - 2014 IEEE 32nd VLSI Test …, 2014 - ieeexplore.ieee.org
Software-Based Self-Test (SBST) is extended to the switches of complex Network-on-Chips
(NoC). Test patterns for structural faults are turned into valid packets by using satisfiability …
(NoC). Test patterns for structural faults are turned into valid packets by using satisfiability …
A framework for combining concurrent checking and on-line embedded test for low-latency fault detection in NoC routers
The focus of the paper is detection of faults in NoC routers by combining concurrent
checkers with embedded on-line test to enable cost-effective trade-offs between area …
checkers with embedded on-line test to enable cost-effective trade-offs between area …
Structural test for graceful degradation of NoC switches
A Dalirsani, S Holst, M Elm… - 2011 Sixteenth IEEE …, 2011 - ieeexplore.ieee.org
Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They
can overcome defective cores, links and switches. As a side effect, yield is increased at the …
can overcome defective cores, links and switches. As a side effect, yield is increased at the …
Automated debugging from pre-silicon to post-silicon
M Dehbashi, G Fey, M Dehbashi, G Fey - … from Pre-Silicon to Post-Silicon, 2015 - Springer
Different approaches have been proposed for automating pre-silicon and post-silicon
debugging. Automated approaches in pre-silicon debugging rely on simulation [VH99], BDD …
debugging. Automated approaches in pre-silicon debugging rely on simulation [VH99], BDD …
Functional diagnosis for graceful degradation of NoC switches
A Dalirsani, HJ Wunderlich - 2016 IEEE 25th Asian Test …, 2016 - ieeexplore.ieee.org
Reconfigurable Networks-on-Chip (NoCs) allow discarding the corrupted ports of a defective
switch instead of deactivating it entirely, and thus enable fine-grained reconfiguration of the …
switch instead of deactivating it entirely, and thus enable fine-grained reconfiguration of the …
A scalable built-in self-recovery (BISR) VLSI architecture and design methodology for 2D-mesh based on-chip networks
Abstract On-Chip Networks (OCN s) have been proposed to solve the complex on-chip
communication problems. In Very Deep-Submicron era, OCN will also be affected by faults …
communication problems. In Very Deep-Submicron era, OCN will also be affected by faults …