Fundamental structure forming phenomena of polycrystalline films and the structure zone models

PB Barna, M Adamik - Thin solid films, 1998 - Elsevier
Previous structure zone models used for the interpretation of the experimental results were
constructed by compiling the various structures found in thick polycrystalline films deposited …

Characterization of thin films produced by the thermal evaporation of silver oxide

MF Al-Kuhaili - Journal of Physics D: Applied Physics, 2007 - iopscience.iop.org
Thin films were produced by the reactive thermal evaporation of pure silver oxide (AgO) in a
background of molecular oxygen. The effects of the deposition rate and oxygen partial …

Columnar structures in polycrystalline thin films developed by competitive growth

M Adamik, PB Barna, I Tomov - Thin Solid Films, 1998 - Elsevier
The formation mechanism of columnar structures is analysed by the investigation of texture
and morphology of oxygen-contaminated aluminium thin films. The responsible mechanism …

Characterization of hafnium oxide thin films prepared by electron beam evaporation

MF Al-Kuhaili, SMA Durrani… - Journal of Physics D …, 2004 - iopscience.iop.org
Thin films of hafnium oxide were deposited by electron beam evaporation. The effects of the
substrate temperature and the oxygen partial pressure on the refractive index and carbon …

Thickness dependence of the electrical and thermoelectric properties of co-evaporated Sb2Te3 films

H Shen, S Lee, J Kang, TY Eom, H Lee, S Han - Applied Surface Science, 2018 - Elsevier
P-type antimony telluride (Sb 2 Te 3) films of various thicknesses (1-, 6-, 10-, and 16-μm)
were deposited on an oxidized Si (100) substrate at 250° C by effusion cell co-evaporation …

Effect of oxygen partial pressure on the structural, optical and electrical properties of sputtered NiO films

AM Reddy, AS Reddy, KS Lee, PS Reddy - Ceramics International, 2011 - Elsevier
Nickel oxide (NiO) thin films were deposited on glass substrates by dc reactive magnetron
sputtering technique. The influence of oxygen partial pressure on the structural …

Preferential orientation in bismuth thin films as a function of growth conditions

SE Rodil, O Garcia-Zarco, E Camps, H Estrada… - Thin Solid Films, 2017 - Elsevier
Bismuth thin films are known to exhibit interesting properties that can be explored for new
applications such as optical or electrical sensors and thermoelectric devices. Due to the …

Correlation between texture and average grain size in polycrystalline Ag thin films

M Adamik, PB Barna, I Tomov - Thin Solid Films, 2000 - Elsevier
The texture and average grain size are investigated in series of silver thin films deposited at
various substrate temperatures and different vacuum conditions, by introducing the 'structure …

Optical properties of erbium oxide thin films deposited by electron beam evaporation

MF Al-Kuhaili, SMA Durrani - Thin Solid Films, 2007 - Elsevier
Erbium oxide thin films were deposited by electron beam evaporation on substrates heated
to 300° C. The effect of the introduction of oxygen on the structural, chemical and optical …

Optical properties of scandium oxide films prepared by electron beam evaporation

MF Al-Kuhaili - Thin Solid Films, 2003 - Elsevier
Scandium oxide films were prepared by electron beam evaporation. The effects of substrate
temperature and oxygen partial pressure on the microstructure and optical properties of the …