Fundamental structure forming phenomena of polycrystalline films and the structure zone models
PB Barna, M Adamik - Thin solid films, 1998 - Elsevier
Previous structure zone models used for the interpretation of the experimental results were
constructed by compiling the various structures found in thick polycrystalline films deposited …
constructed by compiling the various structures found in thick polycrystalline films deposited …
Characterization of thin films produced by the thermal evaporation of silver oxide
MF Al-Kuhaili - Journal of Physics D: Applied Physics, 2007 - iopscience.iop.org
Thin films were produced by the reactive thermal evaporation of pure silver oxide (AgO) in a
background of molecular oxygen. The effects of the deposition rate and oxygen partial …
background of molecular oxygen. The effects of the deposition rate and oxygen partial …
Columnar structures in polycrystalline thin films developed by competitive growth
The formation mechanism of columnar structures is analysed by the investigation of texture
and morphology of oxygen-contaminated aluminium thin films. The responsible mechanism …
and morphology of oxygen-contaminated aluminium thin films. The responsible mechanism …
Characterization of hafnium oxide thin films prepared by electron beam evaporation
MF Al-Kuhaili, SMA Durrani… - Journal of Physics D …, 2004 - iopscience.iop.org
Thin films of hafnium oxide were deposited by electron beam evaporation. The effects of the
substrate temperature and the oxygen partial pressure on the refractive index and carbon …
substrate temperature and the oxygen partial pressure on the refractive index and carbon …
Thickness dependence of the electrical and thermoelectric properties of co-evaporated Sb2Te3 films
P-type antimony telluride (Sb 2 Te 3) films of various thicknesses (1-, 6-, 10-, and 16-μm)
were deposited on an oxidized Si (100) substrate at 250° C by effusion cell co-evaporation …
were deposited on an oxidized Si (100) substrate at 250° C by effusion cell co-evaporation …
Effect of oxygen partial pressure on the structural, optical and electrical properties of sputtered NiO films
AM Reddy, AS Reddy, KS Lee, PS Reddy - Ceramics International, 2011 - Elsevier
Nickel oxide (NiO) thin films were deposited on glass substrates by dc reactive magnetron
sputtering technique. The influence of oxygen partial pressure on the structural …
sputtering technique. The influence of oxygen partial pressure on the structural …
Preferential orientation in bismuth thin films as a function of growth conditions
Bismuth thin films are known to exhibit interesting properties that can be explored for new
applications such as optical or electrical sensors and thermoelectric devices. Due to the …
applications such as optical or electrical sensors and thermoelectric devices. Due to the …
Correlation between texture and average grain size in polycrystalline Ag thin films
The texture and average grain size are investigated in series of silver thin films deposited at
various substrate temperatures and different vacuum conditions, by introducing the 'structure …
various substrate temperatures and different vacuum conditions, by introducing the 'structure …
Optical properties of erbium oxide thin films deposited by electron beam evaporation
MF Al-Kuhaili, SMA Durrani - Thin Solid Films, 2007 - Elsevier
Erbium oxide thin films were deposited by electron beam evaporation on substrates heated
to 300° C. The effect of the introduction of oxygen on the structural, chemical and optical …
to 300° C. The effect of the introduction of oxygen on the structural, chemical and optical …
Optical properties of scandium oxide films prepared by electron beam evaporation
MF Al-Kuhaili - Thin Solid Films, 2003 - Elsevier
Scandium oxide films were prepared by electron beam evaporation. The effects of substrate
temperature and oxygen partial pressure on the microstructure and optical properties of the …
temperature and oxygen partial pressure on the microstructure and optical properties of the …