Ferroic tunnel junctions and their application in neuromorphic networks

R Guo, W Lin, X Yan, T Venkatesan, J Chen - Applied physics reviews, 2020‏ - pubs.aip.org
Brain-inspired neuromorphic computing has been intensively studied due to its potential to
address the inherent energy and throughput limitations of conventional Von-Neumann …

Improved Performance of the Al2O3-Protected HfO2–TiO2 Base Layer with a Self-Assembled CH3NH3PbI3 Heterostructure for Extremely Low Operating …

T George, AV Murugan - ACS Applied Materials & Interfaces, 2022‏ - ACS Publications
Herein, we report intriguing observations of an extremely stable nonvolatile bipolar resistive
switching (NVBRS) memory device fabricated using HfO2–TiO2 topologically protected by …

Impact of Hafnium Do** on Phase Transition, Interface, and Reliability Properties of ZrxHf1–xO2-Based Capacitors

P Vishnumurthy, B Xu, F Wunderwald… - ACS Applied …, 2024‏ - ACS Publications
Zirconium oxide and zirconium-rich Zr x Hf1–x O2 thin films have attracted attention owing to
their switching stability and significant promise for commercial applications such as high …

An electronic synapse memristor device with conductance linearity using quantized conduction for neuroinspired computing

J Zhao, Z Zhou, Y Zhang, J Wang, L Zhang… - Journal of Materials …, 2019‏ - pubs.rsc.org
An electrochemical metallization memristor based on Zr0. 5Hf0. 5O2 film and an active Cu
electrode with quantum conductance and neuromorphic behavior has been reported in this …

Reproducible and reliable resistive switching behaviors of AlO X/HfO X bilayer structures with Al electrode by atomic layer deposition

M Akbari, MK Kim, D Kim, JS Lee - RSC advances, 2017‏ - pubs.rsc.org
The resistive switching behaviors of AlOX/HfOX bilayer structures were investigated. Metal
oxides were deposited by atomic layer deposition. Al and Pt were used as top and bottom …

Hf0. 5Zr0. 5O₂-based ferroelectric field-effect transistors with HfO₂ seed layers for radiation-hard nonvolatile memory applications

C Liu, W **ao, Y Peng, B Zeng, S Zheng… - … on Electron Devices, 2021‏ - ieeexplore.ieee.org
Hf 0.5 Zr 0.5 O 2 (HZO)-based ferroelectric field-effect transistors (FeFETs) with HfO 2 seed
layer were investigated for radiation-hard nonvolatile memory applications. First, it was …

Enhancing reliability in oxide-based memristors using two-dimensional transition metal dichalcogenides

D Lee, SM Kim, JC Park, Y Jung, S Lee, BH Lee… - Applied Surface …, 2025‏ - Elsevier
Oxide-based memristor is an attractive candidate for future nonvolatile resistive random
access memory (RRAM) devices. However, it suffers from insufficient reliability, owing to the …

HfZrOₓ-based ferroelectric tunnel junction with crested symmetric band structure engineering

Y Liu, Y Cao, H Zhu, L Ji, L Chen… - IEEE Electron Device …, 2021‏ - ieeexplore.ieee.org
HfO 2-based ferroelectric tunnel junction (FTJ) devices have been studied as an attractive
candidate in future CMOS-compatible ultra-low-power non-volatile memory techniques …

Synaptic plasticity and quantized conductance states in TiN-Nanoparticles-Based memristor for neuromorphic system

C Mahata, M Ismail, M Kang, S Kim - Nanoscale Research Letters, 2022‏ - Springer
Controlled conductive filament formation in the resistive random access memory device is
an essential requirement for analog resistive switching to develop artificial synapses. In this …

Resistive switching in atomic layer deposited HfO2/ZrO2 nanolayer stacks

L Tang, H Maruyama, T Han, JC Nino, Y Chen… - Applied Surface …, 2020‏ - Elsevier
The resistive switching properties of HfO 2/ZrO 2 nanolayers with the total thickness of 16 nm
prepared using atomic layer deposition (ALD) were investigated. Current-voltage behavior …