Atomic layer-deposited LaAlO3 films for gate dielectrics
KY Ahn, L Forbes - US Patent 7,045,430, 2006 - Google Patents
5,801, 105 5,810,923 5,822.256 5,828,080 5,840,897 5,916,365 5,972,847 6,010,969
6,013,553 6,020,024 6,027,961 6,057,271 6,093.944 6,110,529 6,171,900 6,203,613 …
6,013,553 6,020,024 6,027,961 6,057,271 6,093.944 6,110,529 6,171,900 6,203,613 …
Atomic layer deposition and conversion
GJ Derderian, GS Sandhu - US Patent 7,589,029, 2009 - Google Patents
(56) References Cited A method for growing films for use in integrated circuits using atomic
layer deposition and a subsequent converting US PATENT DOCUMENTS step is described …
layer deposition and a subsequent converting US PATENT DOCUMENTS step is described …
Methods for atomic-layer deposition of aluminum oxides in integrated circuits
KY Ahn, L Forbes - US Patent 7,160,577, 2007 - Google Patents
The present inventors devised unique atomic-layer deposi tion systems, methods, and
apparatus Suitable for aluminum oxide deposition. One exemplary method entails providing …
apparatus Suitable for aluminum oxide deposition. One exemplary method entails providing …
Methods, systems, and apparatus for uniform chemical-vapor depositions
KY Ahn - US Patent 6,852,167, 2005 - Google Patents
Integrated circuits, the key components in thousands of electronic and computer products,
are generally built layer by layer on a silicon substrate. One common technique for forming …
are generally built layer by layer on a silicon substrate. One common technique for forming …
Enhanced atomic layer deposition
S Meng, GJ Derderian, GS Sandhu - US Patent 6,967,154, 2005 - Google Patents
(56) References Cited Woessner & Kluth, PA. US PATENT DOCUMENTS(57) ABSTRACT
3,381,114 A 4/1968 Nakanuma.................. 219/385 A method of enhanced atomic layer …
3,381,114 A 4/1968 Nakanuma.................. 219/385 A method of enhanced atomic layer …
Atomic layer deposited titanium silicon oxide films
KY Ahn, L Forbes - US Patent 7,687,409, 2010 - Google Patents
3,357,961 A 12/1967 Makowski et al. 3,381,114. A 4, 1968 Nakanuma 4,058.430 A 11, 1977
Suntola et al. 4,215,156 A 7, 1980 Dalal et al. 4,302.620 A 11, 1981 Chu 4.333, 808 A …
Suntola et al. 4,215,156 A 7, 1980 Dalal et al. 4,302.620 A 11, 1981 Chu 4.333, 808 A …
Zirconium-doped tantalum oxide films
KY Ahn, L Forbes - US Patent 8,765,616, 2014 - Google Patents
Dielectric layers containing a Zirconium-doped tantalum oxide layer, where the Zirconium-
doped tantalum oxide layer can be formed of one or more monolayers of tantalum oxide …
doped tantalum oxide layer can be formed of one or more monolayers of tantalum oxide …
Write once read only memory employing floating gates
L Forbes - US Patent 7,369,435, 2008 - Google Patents
US7369435B2 - Write once read only memory employing floating gates - Google Patents
US7369435B2 - Write once read only memory employing floating gates - Google Patents Write …
US7369435B2 - Write once read only memory employing floating gates - Google Patents Write …
Fermi-level pinning at the polysilicon/metal-oxide interface-Part II
CC Hobbs, LRC Fonseca, A Knizhnik… - … on Electron Devices, 2004 - ieeexplore.ieee.org
We report here that Fermi pinning at the polysilicon/metal-oxide interface causes high
threshold voltages in MOSFET devices. In Part I, we investigated the different gatestack …
threshold voltages in MOSFET devices. In Part I, we investigated the different gatestack …
Reliability challenges for 45nm and beyond
JW McPherson - Proceedings of the 43rd annual Design Automation …, 2006 - dl.acm.org
Scaling, for enhanced performance and cost reduction, has pushed existing CMOS
materials much closer to their intrinsic reliability limits. This will require that designers will …
materials much closer to their intrinsic reliability limits. This will require that designers will …