Thermal management and packaging of wide and ultra-wide bandgap power devices: a review and perspective

Y Qin, B Albano, J Spencer, JS Lundh… - Journal of physics D …, 2023 - iopscience.iop.org
Power semiconductor devices are fundamental drivers for advances in power electronics,
the technology for electric energy conversion. Power devices based on wide-bandgap …

Near-junction thermal managements of electronics

YC Hua, Y Shen, ZL Tang, DS Tang, X Ran… - Advances in Heat …, 2023 - Elsevier
Near-junction thermal management of electronics has received a lot of attention in the past
decades but there are still many challenges in this area. This chapter provides a …

Effect of drift layer do** and NiO parameters in achieving 8.9 kV breakdown in 100 μm diameter and 4 kV/4 A in 1 mm diameter NiO/β-Ga2O3 rectifiers

JS Li, CC Chiang, X ** in the drift layer and the thickness and extent of extension beyond the
cathode contact of a NiO bilayer in vertical NiO/β-Ga 2 O 3 rectifiers is reported. Decreasing …

Switching figure-of-merit, optimal design, and power loss limit of (ultra-) wide bandgap power devices: A perspective

M Porter, X Yang, H Gong, B Wang, Z Yang… - Applied Physics …, 2024 - pubs.aip.org
Power semiconductor devices are utilized as solid-state switches in power electronics
systems, and their overarching design target is to minimize the conduction and switching …

Near-junction phonon thermal spreading in GaN HEMTs: A comparative study of simulation techniques by full-band phonon Monte Carlo method

Y Shen, HA Yang, BY Cao - International Journal of Heat and Mass …, 2023 - Elsevier
Accurate thermal simulation is essential for the near-junction thermal management and
electro-thermal co-design of GaN HEMTs. While various methods have been employed to …

Breakdown up to 13.5 kV in NiO/β-Ga2O3 vertical heterojunction rectifiers

JS Li, HH Wan, CC Chiang, TJ Yoo… - ECS Journal of Solid …, 2024 - iopscience.iop.org
Vertical heterojunction NiO/β n-Ga 2 O/n+ Ga 2 O 3 rectifiers with 100 μm diameter
fabricated on∼ 17–18 μm thick drift layers with carrier concentration 8.8× 10 15 cm− 3 and …

Ultrathin-Body GaN-on-Sapphire HEMT with Megahertz Switching Capability Under Prompt Irradiation Dose Rate Exceeding 1010 rad(Si)/s

F Zhou, Q Chen, C Zou, W Xu, F Ren… - IEEE Electron …, 2024 - ieeexplore.ieee.org
This work demonstrates ultrathin-body GaN HEMTs on 6-inch sapphire substrate with robust
irradiation hardness against prompt dose rate (PDR) and single-event effect (SEE). By …

Interfacial Optimization for AlN/Diamond Heterostructures via Machine Learning Potential Molecular Dynamics Investigation of the Mechanical Properties

Z Qi, X Sun, Z Sun, Q Wang, D Zhang… - … Applied Materials & …, 2024 - ACS Publications
AlN/diamond heterostructures hold tremendous promise for the development of next-
generation high-power electronic devices due to their ultrawide band gaps and other …

Package Design and Analysis of a 20-kV Double-Sided Silicon Carbide Diode Module With Polymer Nanocomposite Field-Grading Coating

Z Zhang, E Arriola, C Nicholas, J Lynch… - IEEE Transactions …, 2024 - ieeexplore.ieee.org
To tackle the insulation challenges present in packaging medium-voltage (MV) silicon
carbide (SiC) power devices, we developed a package design for a 20-kV SiC. This design …

Breakdown Characteristics of Ga2O3-on-SiC Metal-Oxide-Semiconductor Field-Effect Transistors

M Zhang, L Wang, K Yang, J Yao, W Tang, Y Guo - Crystals, 2023 - mdpi.com
Ultra-wide bandgap semiconductor gallium oxide (Ga2O3) features a breakdown strength of
8 MV/cm and bulk mobility of up to 300 cm2V− 1s− 1, which is considered a promising …