Impact of high-k gate dielectric on analog and RF performance of nanoscale DG-MOSFET

KP Pradhan, SK Mohapatra, PK Sahu… - Microelectronics journal, 2014 - Elsevier
Now a days, high-k dielectrics have been investigated as an alternative to Silicon dioxide
(SiO 2) based gate dielectric for nanoscale semiconductor devices. This paper is an attempt …

Influence of gate and channel engineering on multigate MOSFETs-A review

R Ramesh - Microelectronics journal, 2017 - Elsevier
The design of CMOS circuits using nanoscale MOSFET has become very difficult nowadays
as device modeling faces new challenges such as short channel effects and mobility …

Temperature analysis of a do**less TFET considering interface trap charges for enhanced reliability

S Sharma, R Basu, B Kaur - IEEE Transactions on electron …, 2022 - ieeexplore.ieee.org
The do**less tunnel field-effect transistors (DLTFETs) are captivating researchers over
conventional TFETs as the former eliminates fabrication-related challenges such as random …

Do**less tunnel field-effect transistor with oversized back gate: proposal and investigation

MA Raushan, N Alam - IEEE Transactions on Electron …, 2018 - ieeexplore.ieee.org
Tunnel field-effect transistors (TFETs) have shown attractive device performance making
them a potential candidate to replace MOSFETs in future technologies. However, the …

Symmetric operation in an extended back gate JLFET for scaling to the 5-nm regime considering quantum confinement effects

S Sahay, MJ Kumar - IEEE Transactions on Electron Devices, 2016 - ieeexplore.ieee.org
In this paper, we propose a double gate junctionless FET (DGJLFET) with an extended back
gate (EBG) architecture for significantly improved performance in the sub-10-nm regime …

Retention and scalability perspective of sub-100-nm double gate tunnel FET DRAM

N Navlakha, JT Lin, A Kranti - IEEE Transactions on Electron …, 2017 - ieeexplore.ieee.org
This paper reports on the design optimization of double gate (DG) tunnel FET (TFET) for
dynamic memory applications in sub-100-nm regime. It is shown that incorporation of lateral …

[BOK][B] Nanometer Cmos

F Schwierz, H Wong, JJ Liou - 2010 - books.google.com
This book presents the material necessary for understanding the physics, operation, design,
and performance of modern MOSFETs with nanometer dimensions. It offers a brief …

Wigner function approach

M Nedjalkov, D Querlioz, P Dollfus… - Nano-Electronic Devices …, 2011 - Springer
The Wigner function formalism has been introduced with an emphasis on basic theoretical
aspects, and recently developed numerical approaches and applications for modeling and …

Dual-material double-gate SOI n-MOSFET: gate misalignment analysis

RK Sharma, R Gupta, M Gupta… - IEEE transactions on …, 2009 - ieeexplore.ieee.org
The dual-material double-gate (DMDG) silicon-on-insulator (SOI) metal-oxide-
semiconductor field-effect transistor (MOSFET) is the leading contender for sub-100-nm …

A compact drain current model for graded channel DMDG structure with high-k material

M Lalruatfela, H Chakrabarti, R Maity, A Baidya… - Silicon, 2022 - Springer
This article depicts the drain current for a graded channel double metal double gate
(GCDMDG) device in a unique way. This work offers a thorough examination of the drain …