A review of gallium oxide-based power Schottky barrier diodes

X Ji, C Lu, Z Yan, L Shan, X Yan, J Wang… - Journal of Physics D …, 2022‏ - iopscience.iop.org
Abstract Gallium oxide (Ga 2 O 3) is a representative of ultra-wide bandgap semiconductors,
with a band gap of about 4.9 eV. In addition to a large dielectric constant and excellent …

[HTML][HTML] New approaches and understandings in the growth of cubic silicon carbide

FL Via, M Zimbone, C Bongiorno, A La Magna… - Materials, 2021‏ - mdpi.com
In this review paper, several new approaches about the 3C-SiC growth are been presented.
In fact, despite the long research activity on 3C-SiC, no devices with good electrical …

Ultralarge all‐inorganic perovskite bulk single crystal for high‐performance visible–infrared dual‐modal photodetectors

J Song, Q Cui, J Li, J Xu, Y Wang, L Xu… - Advanced Optical …, 2017‏ - Wiley Online Library
Visible‐infrared dual‐modal light harvesting is crucial for various optoelectronic devices,
particularly for solar cells and photodetectors. For the first time, this study reports on large 25 …

[ספר][B] Gallium nitride and silicon carbide power devices

BJ Baliga - 2016‏ - books.google.com
During the last 30 years, significant progress has been made to improve our understanding
of gallium nitride and silicon carbide device structures, resulting in experimental …

Electron-phonon interaction and longitudinal-transverse phonon splitting in doped semiconductors

F Macheda, P Barone, F Mauri - Physical review letters, 2022‏ - APS
We study the effect of do** on the electron-phonon interaction and on the phonon
frequencies in doped semiconductors, taking into account the screening in the presence of …

Comparison of high voltage and high temperature performances of wide bandgap semiconductors for vertical power devices

C Raynaud, D Tournier, H Morel, D Planson - Diamond and related …, 2010‏ - Elsevier
Temperature dependent properties of wide bandgap semiconductors have been used to
calculate theoretical specific on-resistance, breakdown voltage, and thermal run-away …

Review of wide band-gap semiconductors technology

H **, L Qin, L Zhang, X Zeng… - MATEC Web of …, 2016‏ - matec-conferences.org
Silicon carbide (SiC) and gallium nitride (GaN) are typical representative of the wide band-
gap semiconductor material, which is also known as third-generation semiconductor …

Thermal shock performance of DBA/AMB substrates plated by Ni and Ni–P layers for high-temperature applications of power device modules

C Choe, C Chen, S Noh, K Suganuma - Materials, 2018‏ - mdpi.com
The thermal cycling life of direct bonded aluminum (DBA) and active metal brazing (AMB)
substrates with two types of plating—Ni electroplating and Ni–P electroless plating—was …

Low interface state densities at Al2O3/GaN interfaces formed on vicinal polar and non-polar surfaces

Y Ando, K Nagamatsu, M Deki, N Taoka… - Applied Physics …, 2020‏ - pubs.aip.org
Ni/Al 2 O 3/GaN structures with vicinal GaN surfaces from the c-or m-plane were formed.
Then, electrical interface properties of the structures were systematically investigated. It was …

Effect of moisture on electrical properties and reliability of low dielectric constant materials

YL Cheng, KW Leon, JF Huang, WY Chang… - Microelectronic …, 2014‏ - Elsevier
The effect of absorbed moisture on the electrical characteristics and reliability of low
dielectric constant materials (low-k) was investigated in this study. The experimental results …