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[BUCH][B] System-on-chip test architectures: nanometer design for testability
LT Wang, CE Stroud, NA Touba - 2010 - books.google.com
Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …
technologies, especially nanometer technologies with 90nm or smaller geometry, has …
Generation of electrically induced stimuli for MEMS self-test
A major task for the implementation of Built-In-Self-Test (BIST) strategies for MEMS is the
generation of the test stimuli. These devices can work in different energy domains and are …
generation of the test stimuli. These devices can work in different energy domains and are …
Carnot cycle for an oscillator
J Arnaud, L Chusseau, F Philippe - European journal of physics, 2002 - iopscience.iop.org
In 1824 Carnot established that the efficiency of cyclic engines operating between a hot bath
at absolute temperature T hot and a bath at a lower temperature T cold cannot exceed 1− T …
at absolute temperature T hot and a bath at a lower temperature T cold cannot exceed 1− T …
Built-in-self-test techniques for MEMS
As predicted by technology roadmaps, embedded micro-electro-mechanical-systems
(MEMS) is yet another step in the continuous search for higher levels of integration and …
(MEMS) is yet another step in the continuous search for higher levels of integration and …
Electrically induced stimuli for MEMS self-test
A major problem for applying self-test techniques to MEMS is the multi-domain nature of the
sensing parts that require special test equipment for stimuli generation. In this work we …
sensing parts that require special test equipment for stimuli generation. In this work we …
Analysis of failure sources in surface-micromachined MEMS
N Deb, RD Blanton - … Test Conference 2000 (IEEE Cat. No …, 2000 - ieeexplore.ieee.org
The effect of vertical stiction, foreign particles, and etch variation on the resonant frequency
of a surface-micromachined resonator and accelerometer are presented. For each device, it …
of a surface-micromachined resonator and accelerometer are presented. For each device, it …
Fault modeling and fault simulation in mixed micro-fluidic microelectronic systems
HG Kerkhoff, HPA Hendriks - Journal of electronic testing, 2001 - Springer
Developments in electronic/fluidic microsystems are progressing rapidly. The ultimate goal
is to deliver products in the 10,000 fluidic reaction-wells range. Exciting applications include …
is to deliver products in the 10,000 fluidic reaction-wells range. Exciting applications include …
Extending fault-based testing to microelectromechanical systems
As stable fabrication processes for MicroElectroMechanical Systems (MEMS) emerge,
research efforts shift towards the design of systems of increasing complexity. The ways in …
research efforts shift towards the design of systems of increasing complexity. The ways in …
Evaluation of the oscillation-based test methodology for micro-electro-mechanical systems
In this paper, Oscillation-based Test Methodology (OTM) is evaluated in the context of
MEMS testing. Both qualitative and quantitative evaluations of fault coverage are discussed …
MEMS testing. Both qualitative and quantitative evaluations of fault coverage are discussed …
Fault simulation and modelling of microelectromechanical systems
R Rosing, A Lechner, A Richardson, A Dorey - Computing & Control …, 2000 - IET
High-reliability and safety-critical markets for microelectromechanical systems are driving
new proposals for the integration of efficient built-in test and monitoring functions. The …
new proposals for the integration of efficient built-in test and monitoring functions. The …