[BUCH][B] System-on-chip test architectures: nanometer design for testability

LT Wang, CE Stroud, NA Touba - 2010 - books.google.com
Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

Generation of electrically induced stimuli for MEMS self-test

B Charlot, S Mir, F Parrain, B Courtois - Journal of electronic testing, 2001 - Springer
A major task for the implementation of Built-In-Self-Test (BIST) strategies for MEMS is the
generation of the test stimuli. These devices can work in different energy domains and are …

Carnot cycle for an oscillator

J Arnaud, L Chusseau, F Philippe - European journal of physics, 2002 - iopscience.iop.org
In 1824 Carnot established that the efficiency of cyclic engines operating between a hot bath
at absolute temperature T hot and a bath at a lower temperature T cold cannot exceed 1− T …

Built-in-self-test techniques for MEMS

S Mir, L Rufer, A Dhayni - Microelectronics journal, 2006 - Elsevier
As predicted by technology roadmaps, embedded micro-electro-mechanical-systems
(MEMS) is yet another step in the continuous search for higher levels of integration and …

Electrically induced stimuli for MEMS self-test

B Charlot, S Mir, F Parrain… - Proceedings 19th IEEE …, 2001 - ieeexplore.ieee.org
A major problem for applying self-test techniques to MEMS is the multi-domain nature of the
sensing parts that require special test equipment for stimuli generation. In this work we …

Analysis of failure sources in surface-micromachined MEMS

N Deb, RD Blanton - … Test Conference 2000 (IEEE Cat. No …, 2000 - ieeexplore.ieee.org
The effect of vertical stiction, foreign particles, and etch variation on the resonant frequency
of a surface-micromachined resonator and accelerometer are presented. For each device, it …

Fault modeling and fault simulation in mixed micro-fluidic microelectronic systems

HG Kerkhoff, HPA Hendriks - Journal of electronic testing, 2001 - Springer
Developments in electronic/fluidic microsystems are progressing rapidly. The ultimate goal
is to deliver products in the 10,000 fluidic reaction-wells range. Exciting applications include …

Extending fault-based testing to microelectromechanical systems

S Mir, B Charlot, B Courtois - Journal of Electronic Testing, 2000 - Springer
As stable fabrication processes for MicroElectroMechanical Systems (MEMS) emerge,
research efforts shift towards the design of systems of increasing complexity. The ways in …

Evaluation of the oscillation-based test methodology for micro-electro-mechanical systems

V Beroulle, Y Bertrand, L Latorre… - Proceedings 20th IEEE …, 2002 - ieeexplore.ieee.org
In this paper, Oscillation-based Test Methodology (OTM) is evaluated in the context of
MEMS testing. Both qualitative and quantitative evaluations of fault coverage are discussed …

Fault simulation and modelling of microelectromechanical systems

R Rosing, A Lechner, A Richardson, A Dorey - Computing & Control …, 2000 - IET
High-reliability and safety-critical markets for microelectromechanical systems are driving
new proposals for the integration of efficient built-in test and monitoring functions. The …