Surface science, MEMS and NEMS: Progress and opportunities for surface science research performed on, or by, microdevices

D Berman, J Krim - Progress in Surface Science, 2013 - Elsevier
Micro-and Nano-Electro-Mechanical Systems (MEMS and NEMS) represent existing
(MEMS) and emerging (NEMS) technologies based on microfabrication of micron to …

High-speed scanning tunneling microscope technique and its application in studying structural dynamics on surfaces

Z Yang, HJ Freund - Progress in Surface Science, 2024 - Elsevier
The study of processes concerning adsorption, diffusion and reaction of atoms and
molecules on surfaces is one of the core areas of surface science research. Resolving these …

Capacitive RF MEMS switch dielectric charging and reliability: a critical review with recommendations

WM Van Spengen - Journal of Micromechanics and …, 2012 - iopscience.iop.org
This paper presents a comprehensive review of the reliability issues hampering capacitive
RF MEMS switches in their development toward commercialization. Dielectric charging and …

Electrons, photons, and force: quantitative single-molecule measurements from physics to biology

SA Claridge, JJ Schwartz, PS Weiss - ACS nano, 2011 - ACS Publications
Single-molecule measurement techniques have illuminated unprecedented details of
chemical behavior, including observations of the motion of a single molecule on a surface …

Recent developments in dimensional nanometrology using AFMs

A Yacoot, L Koenders - Measurement Science and Technology, 2011 - iopscience.iop.org
Scanning probe microscopes, in particular the atomic force microscope (AFM), have
developed into sophisticated instruments that, throughout the world, are no longer used just …

High-speed AFM reveals the dynamics of single biomolecules at the nanometer scale

AJ Katan, C Dekker - Cell, 2011 - cell.com
Atomic force microscopy allows visualization of biomolecules with nanometer resolution
under physiological conditions. Recent advances have improved the time resolution of the …

In-line metrology of nanoscale features in semiconductor manufacturing systems

TF Yao, A Duenner, M Cullinan - Precision Engineering, 2017 - Elsevier
Quality control and defect monitoring are of great importance to the semiconductor industry.
This article presents a system to enable inspection of nanoscale features in-line with …

High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers

JD Adams, A Nievergelt, BW Erickson… - Review of Scientific …, 2014 - pubs.aip.org
We present an atomic force microscope (AFM) head for optical beam deflection on small
cantilevers. Our AFM head is designed to be small in size, easily integrated into a …

The new FAST module: A portable and transparent add-on module for time-resolved investigations with commercial scanning probe microscopes

C Dri, M Panighel, D Tiemann, LL Patera, G Troiano… - Ultramicroscopy, 2019 - Elsevier
Time resolution is one of the most severe limitations of scanning probe microscopies
(SPMs), since the typical image acquisition times are in the order of several seconds or even …

The FAST module: an add-on unit for driving commercial scanning probe microscopes at video rate and beyond

F Esch, C Dri, A Spessot, C Africh, G Cautero… - Review of Scientific …, 2011 - pubs.aip.org
We present the design and the performance of the FAST (Fast Acquisition of SPM
Timeseries) module, an add-on instrument that can drive commercial scanning probe …