Emerging trends in wide band gap semiconductors (SiC and GaN) technology for power devices

F Roccaforte, P Fiorenza, G Greco, RL Nigro… - Microelectronic …, 2018 - Elsevier
Among the wide band gap (WBG) semiconductors, silicon carbide (4H-SiC) and gallium
nitride (GaN) are nowadays recognized as outstanding materials for the future of power …

Characterization of SiO2/4H-SiC Interfaces in 4H-SiC MOSFETs: A Review

P Fiorenza, F Giannazzo, F Roccaforte - Energies, 2019 - mdpi.com
This paper gives an overview on some state-of-the-art characterization methods of SiO2/4H-
SiC interfaces in metal oxide semiconductor field effect transistors (MOSFETs). In particular …

Recent advances on dielectrics technology for SiC and GaN power devices

F Roccaforte, P Fiorenza, G Greco, M Vivona… - Applied Surface …, 2014 - Elsevier
Silicon carbide (SiC) and gallium nitride (GaN) devices are considered as optimal solutions
to meet the requirements of the modern power electronics. In fact, they can allow an …

Selective do** in silicon carbide power devices

F Roccaforte, P Fiorenza, M Vivona, G Greco… - Materials, 2021 - mdpi.com
Silicon carbide (SiC) is the most mature wide band-gap semiconductor and is currently
employed for the fabrication of high-efficiency power electronic devices, such as diodes and …

Challenges for energy efficient wide band gap semiconductor power devices

F Roccaforte, P Fiorenza, G Greco… - … status solidi (a), 2014 - Wiley Online Library
Wide band gap semiconductors, and in particular silicon carbide (4H‐SiC) and gallium
nitride (GaN), are very promising materials for the next generation of power electronics, to …

Ion implantation do** in silicon carbide and gallium nitride electronic devices

F Roccaforte, F Giannazzo, G Greco - Micro, 2022 - mdpi.com
Wide band gap semiconductors such as silicon carbide (SiC) and gallium nitride (GaN) are
excellent materials for the next generation of high-power and high-frequency electronic …

The current status and trends of 1,200-V commercial silicon-carbide MOSFETs: Deep physical analysis of power transistors from a designer's perspective

AO Adan, D Tanaka, L Burgyan… - IEEE Power Electronics …, 2019 - ieeexplore.ieee.org
There is continuous activity to increase the efficiency and reduce the size of power electronic
systems and modules developed for transportation and automotive electrification …

Structural and insulating behaviour of high-permittivity binary oxide thin films for silicon carbide and gallium nitride electronic devices

R Lo Nigro, P Fiorenza, G Greco, E Schilirò… - Materials, 2022 - mdpi.com
High-κ dielectrics are insulating materials with higher permittivity than silicon dioxide. These
materials have already found application in microelectronics, mainly as gate insulators or …

SiO2/4H-SiC interface do** during post-deposition-annealing of the oxide in N2O or POCl3

P Fiorenza, F Giannazzo, M Vivona… - Applied Physics …, 2013 - pubs.aip.org
In this Letter, we report a quantitative analysis of the n-type do** occurring at SiO 2/4H-
SiC interfaces during post-deposition-annealing (PDA) in N 2 O or POCl 3 of a 45 nm thick …

Mobility enhancement in heavily doped 4H-SiC (0001),(112̄0), and (11̄00) MOSFETs via an oxidation-minimizing process

K Tachiki, K Mikami, K Ito, M Kaneko… - Applied Physics …, 2022 - iopscience.iop.org
The effects of a process that minimizes oxidation of SiC on the channel mobility of heavily
doped 4H-SiC (0001),(11 bar 2 0) and (1 bar 1 00) metal-oxide-semiconductor field-effect …