CMOS‐technology‐enabled flexible and stretchable electronics for internet of everything applications

AM Hussain, MM Hussain - Advanced Materials, 2016 - Wiley Online Library
Flexible and stretchable electronics can dramatically enhance the application of electronics
for the emerging Internet of Everything applications where people, processes, data and …

The negative bias temperature instability in MOS devices: A review

JH Stathis, S Zafar - Microelectronics Reliability, 2006 - Elsevier
Negative bias temperature instability (NBTI), in which interface traps and positive oxide
charge are generated in metal–oxide–silicon (MOS) structures under negative gate bias, in …

Suppression of charge carrier recombination in lead-free tin halide perovskite via Lewis base post-treatment

MA Kamarudin, D Hirotani, Z Wang… - The journal of …, 2019 - ACS Publications
Lead-free tin perovskite solar cells (PSCs) show the most promise to replace the more toxic
lead-based perovskite solar cells. However, the efficiency is significantly less than that of …

Ultrathin (< 4 nm) SiO2 and Si–O–N gate dielectric layers for silicon microelectronics: Understanding the processing, structure, and physical and electrical limits

ML Green, EP Gusev, R Degraeve… - Journal of Applied …, 2001 - pubs.aip.org
The outstanding properties of SiO2, which include high resistivity, excellent dielectric
strength, a large band gap, a high melting point, and a native, low defect density interface …

Dielectric breakdown mechanisms in gate oxides

S Lombardo, JH Stathis, BP Linder, KL Pey… - Journal of applied …, 2005 - pubs.aip.org
In this paper we review the subject of oxide breakdown (BD), focusing our attention on the
case of the gate dielectrics of interest for current Si microelectronics, ie, Si oxides or …

A passivating contact for silicon solar cells formed during a single firing thermal annealing

A Ingenito, G Nogay, Q Jeangros, E Rucavado… - Nature Energy, 2018 - nature.com
Passivating contacts are indispensable for achieving high conversion efficiency in crystalline-
silicon solar cells. Their realization and integration into a convenient process flow have …

What can electron paramagnetic resonance tell us about the system?

PM Lenahan, JF Conley Jr - Journal of Vacuum Science & Technology …, 1998 - pubs.aip.org
Electron paramagnetic resonance (EPR) measurements of Si/SiO 2 systems began over 30
years ago. Most EPR studies of Si/SiO 2 systems have dealt with two families of defects: P b …

Mechanism for stress‐induced leakage currents in thin silicon dioxide films

DJ DiMaria, E Cartier - Journal of Applied physics, 1995 - pubs.aip.org
Leakage currents introduced in the low‐field, direct‐tunneling regime of thin oxides during
high‐field stress are related to defects produced by hot‐electron transport in the oxide layer …

Generalized diffusion-reaction model for the low-field charge-buildup instability at the Si- interface

S Ogawa, N Shiono - Physical Review B, 1995 - APS
We present a unified phenomenological model of the low-field charge-buildup phenomenon
at ultrathin SiO 2-Si interfaces during negative-bias stresses at elevated temperatures and …

Defect related luminescence in silicon dioxide network: a review

R Salh - Crystalline Silicon-Properties and Uses, 2011 - books.google.com
The discovery of strong luminescence at room temperature from silicon cluster has attracted
an enormous attention in recent years due to its potential applications in Si-based …