Improved predictions of lead free solder joint reliability that include aging effects

M Motalab, Z Cai, JC Suhling, J Zhang… - 2012 IEEE 62nd …, 2012 - ieeexplore.ieee.org
It has been demonstrated that isothermal aging leads to large reductions (up to 50%) in
several key material properties for lead free solders including stiffness (modulus), yield …

A critical review of constitutive models for solders in electronic packaging

G Chen, X Zhao, H Wu - Advances in Mechanical …, 2017 - journals.sagepub.com
Owing to their superior electrical, thermal, and mechanical properties, solder joints are the
most widely used interconnection materials in electronic product packaging. Because the …

Determination of Anand constants for SAC solders using stress-strain or creep data

M Motalab, Z Cai, JC Suhling… - … Conference on Thermal …, 2012 - ieeexplore.ieee.org
The Anand viscoplastic constitutive model is often used to represent the deformation
behavior of solders in electronic assemblies. In the Anand model, plasticity and creep are …

Correlation of reliability models including aging effects with thermal cycling reliability data

M Motalab, M Mustafa, JC Suhling… - 2013 IEEE 63rd …, 2013 - ieeexplore.ieee.org
The microstructure, mechanical response, and failure behavior of lead free solder joints in
electronic assemblies are constantly evolving when exposed to isothermal aging and/or …

Finite element analysis of the effect of process-induced voids on the fatigue lifetime of a lead-free solder joint under thermal cycling

L Benabou, V Etgens, QB Tao - Microelectronics Reliability, 2016 - Elsevier
Process-induced voids remain one of the key concerns in thermo-mechanical reliability of
solder alloys. Previous studies reported that the void effect on fatigue failure reliability of …

The effects of aging on the Anand viscoplastic constitutive model for SAC305 solder

MM Basit, M Motalab, JC Suhling… - … Conference on Thermal …, 2014 - ieeexplore.ieee.org
Lead free solder materials are widely used in electronic packaging industry due to
environmental concerns. However, experimental testing and microstructural characterization …

The Anand parameters for SAC solders after extreme aging

M Basit, S Ahmed, M Motalab… - 2016 15th IEEE …, 2016 - ieeexplore.ieee.org
The mechanical behavior of lead free solder materials is often represented using the Anand
viscoplastic constitutive model. This nine parameter model is built into popular commercial …

Optimization for warpage and residual stress due to reflow process in IGBT modules based on pre-warped substrate

Y Zhou, L Xu, S Liu - Microelectronic Engineering, 2015 - Elsevier
Inevitable and severe warpage and stress due to serious mismatch in coefficient of thermal
expansion (CTE) between direct bond copper (DBC) plate and copper substrate will be …

Characterization of doped SAC solder materials and determination of Anand parameters

S Ahmed, M Basit, JC Suhling… - International …, 2015 - asmedigitalcollection.asme.org
In the electronic packaging industry, it is important to be able to make accurate predictions of
board level solder joint reliability during thermal cycling exposures. The Anand viscoelastic …

Thermal induced interface mechanical response analysis of SMT lead-free solder joint and its adaptive optimization

S Liu, Y Yan, Y Zhou, B Han, B Wang, D Zhang, S Xue… - Micromachines, 2022 - mdpi.com
Surface mount technology (SMT) plays an important role in integrated circuits, but due to
thermal stress alternation caused by temperature cycling, it tends to have thermo …