Recent advancements in materials science have shed light on the potential of exploring
hierarchical assemblies of molecules on surfaces, driven by both fundamental and …

The charge distribution in materials at the nanoscale can often explain the origin of
macroscopic properties such as localized conductivity or the plasmonic response and …

Herein, a spinel alumina structure photocatalyst was prepared by a one-pot modified sol–gel
technique with rational design and unique electronic structure evolution by Cu do** in the …

A key issue in the development of high-performance semiconductor devices is the ability to
properly measure active dopants at the nanometer scale. In ap–n junction, the abruptness of …

As a primary energy source, electricity drives broad fields from everyday electronic circuits to
industrial chemical catalysis. From a chemistry viewpoint, studying electric field effects on …

Momentum resolved 4D-STEM, also called center of mass (CoM) analysis, has been used to
measure the long range built-in electric field of a silicon p–n junction. The effect of different …

Differential phase contrast (DPC) in scanning transmission electron microscopy can be used
to visualize electric field distributions within specimens in real space. However, for electric …

Characterizing long‐range electric fields and built‐in potentials in functional materials at
nano to micrometer scales is of supreme importance for optimizing devices, eg, the …

We demonstrate the use of both pixelated differential phase contrast (DPC) scanning
transmission electron microscopy (STEM) and off-axis electron holography (EH) for the …

We report the precise measurement of electric fields in nanostructures, and high-contrast
imaging of soft matter at ultralow electron doses by transmission electron microscopy (TEM) …