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Probing charge traps at the 2D semiconductor/dielectric interface
The family of 2-dimensional (2D) semiconductors is a subject of intensive scientific research
due to their potential in next-generation electronics. While offering many unique properties …
due to their potential in next-generation electronics. While offering many unique properties …
Characterizing Defects Inside Hexagonal Boron Nitride Using Random Telegraph Signals in van der Waals 2D Transistors
Z Huang, RG Lee, E Cuniberto, J Song, J Lee… - ACS …, 2024 - ACS Publications
Single-crystal hexagonal boron nitride (hBN) is used extensively in many two-dimensional
electronic and quantum devices, where defects significantly impact performance. Therefore …
electronic and quantum devices, where defects significantly impact performance. Therefore …
Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs
Evidence of microscopic inhomogeneities of the side source/drain contacts in 300 mm wafer
integrated MoS2 field-effect transistors is presented. In particular, the presence of a limited …
integrated MoS2 field-effect transistors is presented. In particular, the presence of a limited …
A stochastic encoder using point defects in two-dimensional materials
H Ravichandran, T Knobloch… - Nature …, 2024 - nature.com
While defects are undesirable for the reliability of electronic devices, particularly in scaled
microelectronics, they have proven beneficial in numerous quantum and energy-harvesting …
microelectronics, they have proven beneficial in numerous quantum and energy-harvesting …
Experimental-Modeling Framework for Identifying Defects Responsible for Reliability Issues in 2D FETs
In this work, a self-consistent method is used to identify and describe defects plaguing 300
mm integrated 2D field-effect transistors. This method requires measurements of the transfer …
mm integrated 2D field-effect transistors. This method requires measurements of the transfer …
Dopant-mediated carrier tunneling in short-channel two-dimensional transistors
Substitutional do** has played a pivotal role in silicon-based electronics and holds
equivalent importance for emerging two-dimensional (2D) semiconductors, which show …
equivalent importance for emerging two-dimensional (2D) semiconductors, which show …
Interfacial engineering-induced electronic state modulation in Ru/MoS 2 heterostructures for efficient hydrogen evolution reaction
N Wang, Y Zhang, C Zhang, X Wang, S Dai… - Chemical …, 2025 - pubs.rsc.org
In traditional binary heterojunction catalysts, mismatched energy band structures lead to
higher electron transfer barriers. By reducing the work function difference via a ternary Ru …
higher electron transfer barriers. By reducing the work function difference via a ternary Ru …
Exploring the Potential of Substituted and Defected Magnesium Dichloride Monolayers for Optoelectronic Applications
In this study, the effects of vacancy defects and substitutional do** on the structural,
electronic, and linear optical characteristics of the magnesium dichloride (MgCl2) monolayer …
electronic, and linear optical characteristics of the magnesium dichloride (MgCl2) monolayer …
Multiparameter Admittance Spectroscopy for Investigating Defects in MoSTEXPRESERVE0 Thin-Film MOSFETs
We present a method for assessing the quality of electronic material properties of thin-film
metal–oxide–semiconductor field-effect transistors (MOSFETs). By investigating samples …
metal–oxide–semiconductor field-effect transistors (MOSFETs). By investigating samples …
Decoupling Current and Voltage Mediated Breakdown Mechanisms in CVD MoS2 FETs
We report distinct breakdown mechanisms in CVD monolayer MoS2 FET devices for the first
time mediated by either voltage or currents in devices. A detailed analysis of the breakdown …
time mediated by either voltage or currents in devices. A detailed analysis of the breakdown …