Standards for the characterization of endurance in resistive switching devices

M Lanza, R Waser, D Ielmini, JJ Yang, L Goux… - ACS …, 2021 - ACS Publications
Resistive switching (RS) devices are emerging electronic components that could have
applications in multiple types of integrated circuits, including electronic memories, true …

Nanoionic memristive phenomena in metal oxides: the valence change mechanism

R Dittmann, S Menzel, R Waser - Advances in Physics, 2021 - Taylor & Francis
This review addresses resistive switching devices operating according to the bipolar
valence change mechanism (VCM), which has become a major trend in electronic materials …

Resistive switching memories based on metal oxides: mechanisms, reliability and scaling

D Ielmini - Semiconductor Science and Technology, 2016 - iopscience.iop.org
With the explosive growth of digital data in the era of the Internet of Things (IoT), fast and
scalable memory technologies are being researched for data storage and data-driven …

Nonvolatile memory device using a varistor as a current limiter element

M Tendulkar, I Hashim, Y Wang - US Patent 8,686,386, 2014 - Google Patents
US PATENT DOCUMENTS memory device. In some embodiments, the current limiting
component comprises a varistor that is a current limiting material disposed within a resistive …

Modeling the universal set/reset characteristics of bipolar RRAM by field-and temperature-driven filament growth

D Ielmini - IEEE Transactions on Electron Devices, 2011 - ieeexplore.ieee.org
Resistive switching memory (RRAM) devices generally rely on the formation/dissolution of
conductive filaments through insulating materials, such as metal oxides and chalcogenide …

Statistical Fluctuations in HfOx Resistive-Switching Memory: Part I - Set/Reset Variability

S Ambrogio, S Balatti, A Cubeta… - … on electron devices, 2014 - ieeexplore.ieee.org
Resistive switching memory (RRAM) relies on the voltage-driven formation/disruption of a
conductive filament (CF) across a thin insulating layer. Due to the 1-D structure of the CF …

Thermophoresis/diffusion as a plausible mechanism for unipolar resistive switching in metal–oxide–metal memristors

DB Strukov, F Alibart, R Stanley Williams - Applied Physics A, 2012 - Springer
We show that the SET operation of a unipolar memristor could be explained by
thermophoresis, or the Soret effect, which is the diffusion of atoms, ions or vacancies in a …

A collective study on modeling and simulation of resistive random access memory

D Panda, PP Sahu, TY Tseng - Nanoscale research letters, 2018 - Springer
In this work, we provide a comprehensive discussion on the various models proposed for the
design and description of resistive random access memory (RRAM), being a nascent …

Resistive switching by voltage-driven ion migration in bipolar RRAM—Part I: Experimental study

F Nardi, S Larentis, S Balatti… - IEEE Transactions on …, 2012 - ieeexplore.ieee.org
Resistive-switching random access memory (RRAM) based on the formation and the
dissolution of a conductive filament (CF) through insulating materials, eg, transition metal …

Thermal crosstalk in 3-dimensional RRAM crossbar array

P Sun, N Lu, L Li, Y Li, H Wang, H Lv, Q Liu, S Long… - Scientific reports, 2015 - nature.com
Abstract High density 3-dimensional (3D) crossbar resistive random access memory
(RRAM) is one of the major focus of the new age technologies. To compete with the ultra …