Emerging trends in wide band gap semiconductors (SiC and GaN) technology for power devices

F Roccaforte, P Fiorenza, G Greco, RL Nigro… - Microelectronic …, 2018 - Elsevier
Among the wide band gap (WBG) semiconductors, silicon carbide (4H-SiC) and gallium
nitride (GaN) are nowadays recognized as outstanding materials for the future of power …

[HTML][HTML] An overview of normally-off GaN-based high electron mobility transistors

F Roccaforte, G Greco, P Fiorenza, F Iucolano - Materials, 2019 - mdpi.com
Today, the introduction of wide band gap (WBG) semiconductors in power electronics has
become mandatory to improve the energy efficiency of devices and modules and to reduce …

Review of technology for normally-off HEMTs with p-GaN gate

G Greco, F Iucolano, F Roccaforte - Materials Science in Semiconductor …, 2018 - Elsevier
Owing to the high carrier density and high electron mobility of the two dimensional electron
gas (2DEG), high electron mobility transistors (HEMTs) based on gallium nitride (GaN) are …

Recent developments in materials, architectures and processing of AlGaN/GaN HEMTs for future RF and power electronic applications: A critical review

B Mounika, J Ajayan, S Bhattacharya, D Nirmal - Micro and Nanostructures, 2022 - Elsevier
This article critically reviews the architectural novelties, emerging materials (substrate,
buffer, barrier & contact materials), technological advancements, processing techniques …

Maximizing the performance of 650-V p-GaN gate HEMTs: Dynamic RON characterization and circuit design considerations

H Wang, J Wei, R **e, C Liu, G Tang… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
The systematic characterization of a 650-V/13-A enhancement-mode GaN power transistor
with p-GaN gate is presented. Critical device parameters such as ON-resistance R ON and …

Threshold voltage instability in p-GaN gate AlGaN/GaN HFETs

L Sayadi, G Iannaccone, S Sicre… - … on Electron Devices, 2018 - ieeexplore.ieee.org
We investigate the impact of the gate contact on the threshold voltage stability in p-GaN gate
AlGaN/GaN heterojunction field-effect transistors with double pulse measurements on the p …

[HTML][HTML] Technology and reliability of normally-off GaN HEMTs with p-type gate

M Meneghini, O Hilt, J Wuerfl, G Meneghesso - Energies, 2017 - mdpi.com
GaN-based transistors with p-GaN gate are commonly accepted as promising devices for
application in power converters, thanks to the positive and stable threshold voltage, the low …

VTH Instability of -GaN Gate HEMTs Under Static and Dynamic Gate Stress

J He, G Tang, KJ Chen - IEEE Electron Device Letters, 2018 - ieeexplore.ieee.org
The impacts of static and dynamic gate stress on the threshold voltage () instability in
Schottky-type-GaN gate AlGaN/GaN heterojunction field-effect transistors are experimentally …

On the physical operation and optimization of the p-GaN gate in normally-off GaN HEMT devices

L Efthymiou, G Longobardi, G Camuso, T Chien… - Applied Physics …, 2017 - pubs.aip.org
In this study, an investigation is undertaken to determine the effect of gate design
parameters on the on-state characteristics (threshold voltage and gate turn-on voltage) of …

[HTML][HTML] Development of GaN HEMTs fabricated on silicon, silicon-on-insulator, and engineered substrates and the heterogeneous integration

LH Hsu, YY Lai, PT Tu, C Langpoklakpam, YT Chang… - Micromachines, 2021 - mdpi.com
GaN HEMT has attracted a lot of attention in recent years owing to its wide applications from
the high-frequency power amplifier to the high voltage devices used in power electronic …