With shrinking feature sizes, transistor aging due to NBTI and HCI becomes a major
reliability challenge for microprocessors. These processes lead to increased gate delays …

Predicting performance under Dynamic Voltage Frequency Scaling (DVFS) remains an
open problem. Current best practice explores available performance counters to serve as …

Ensuring lifetime reliability of microprocessors has become more critical. Continuous scaling
and increasing temperatures due to growing power density are threatening lifetime …

As CMOS technology scales down into the nanometer regime, designers have to add
pessimistic timing margins to the circuit as guardbands to avoid timing violations due to …

Reliability has become a more serious design challenge for current nanometer very large-
scale integrated (VLSI) circuits especially as the technology has advanced into 7nm. It was …

Digital multipliers are among the most critical arithmetic functional units. The overall
performance of these systems depends on the throughput of the multiplier. Meanwhile, the …

Bias Temperature Instability (BTI) and Hot Carrier Injections (HCI) are two of the main effects
that increase a transistor's threshold voltage and further cause performance degradations …

Rapid device aging in the nano era threatens system lifetime reliability, posing a major
intrinsic threat to system functionality. Traditional techniques to overcome the aging-induced …

The pervasiveness of heterogeneous multiprocessors (HMP) in the mobile domain enables
more energy efficient systems. However, current approaches to exploit the energy efficiency …

One of the essential requirements of embedded systems is a guaranteed level of reliability.
In this regard, fault-tolerance techniques are broadly applied to these systems to enhance …